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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Kleider, Jean-Paul
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (28/28 displayed)
- 2024Surface photovoltage study of perovskite materials and structures for solar cell applications
- 2024Three Terminal Organic-Silicon Tandem Models
- 2023Elucidating Interfacial Limitations Induced by Tin Oxide Electron Selective Layer Grown by Atomic Layer Deposition in N−I−P Perovskite-Based Solar Cellscitations
- 2023The modulated photoluminescence technique versus temperature: opportunities for better determination of trap parameters
- 2022Characterization of semiconductors from photoconductivity techniques: uniform and polychromatic illumination
- 2022Surface photovoltage study of metal halide perovskites deposited directly on crystalline silicon
- 2022Surface photovoltage characterisation of metal halide perovskite on crystalline silicon using Kelvin probe force microscopy and metal-insulator-semiconductor configurationcitations
- 2021Evolution of the surface passivation mechanism during the fabrication of ex-situ doped poly-Si(B)/SiOx passivating contacts for high-efficiency c-Si solar cellscitations
- 2021Evolution of the surface passivation mechanism during the fabrication of ex-situ doped poly-Si(B)/SiOx passivating contacts for high-efficiency c-Si solar cellscitations
- 2021Carrier gradients and the role of charge selective contacts in lateral heterojunction all back contact perovskite solar cellscitations
- 2021Space charge capacitance study of GaP/Si multilayer structures grown by plasma depositioncitations
- 2021Surface photovoltage characterisation of metal halide perovskite on c-SI using kelvin probe force microscopy and metal-insulator-semiconductor configuration
- 2019Heteroepitaxial growth of silicon on GaAs via low-temperature plasma-enhanced chemical vapor depositioncitations
- 2019Building blocks development for defect-free growth of GaAs on silicon for tandem solar cells
- 2019SiOxNy:B layers for ex-situ doping of hole-selective poly silicon contacts: A passivation studycitations
- 2018Conductivity and Surface Passivation Properties of Boron‐Doped Poly‐Silicon Passivated Contacts for c‐Si Solar Cellscitations
- 2018Heteroepitaxial growth of Silicon on GaAs via low temperature plasma-enhanced chemical vapor deposition
- 2018Improvement of the conductivity and surface passivation properties of boron-doped poly-silicon on oxidecitations
- 2017Coupling Optical and Electrical Modelling for the study of a-Si:H-based nanowire Array Solar Cellscitations
- 2017Coupling Optical and Electrical Modelling for the study of a-Si:H-based nanowire Array Solar Cellscitations
- 2017Influence of PE-ALD of GaP on the Silicon Wafers Qualitycitations
- 2015Revisiting the theory and usage of junction capacitance: Application to high efficiency amorphous/crystalline silicon heterojunction solar cellscitations
- 2013n-type a-Si:H layers applied to the back side of heterojunction solar cells: Experimental and simulation analysiscitations
- 2013n-type a-Si:H layers applied to the back side of heterojunction solar cells: Experimental and simulation analysiscitations
- 2012Amorphous silicon diamond based heterojunctions with high rectification ratiocitations
- 2012Nanowire solar cells using hydrogenated amorphous silicon: a modeling studycitations
- 2009An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy
- 2007Scaling analysis of field-enhanced bandtail hopping transport in amorphous carbon nitridecitations
Places of action
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article
Evolution of the surface passivation mechanism during the fabrication of ex-situ doped poly-Si(B)/SiOx passivating contacts for high-efficiency c-Si solar cells
Abstract
Passivating the contacts of crystalline silicon (c-Si) solar cells (SC) with a poly-crystalline silicon (poly-Si) layer on top of a thin silicon oxide (SiOx) is currently sparking interest for reducing carrier recombination at the interface between the metal electrode and the c-Si substrate. However, due to the interrelation between different mechanisms at play, a comprehensive understanding of the surface passivation provided by the poly-Si/SiOx contact in the final SC has not been achieved yet. In the present work, we report on an original ex-situ doping process of the poly-Si layer through the deposition of a B-rich dielectric layer followed by an annealing step to diffuse B dopants in the layer. We propose an in-depth investigation of the passivation scheme of the resulting B-doped poly-Si/SiOx contact by first comparing the surface passivation provided by ex-situ doped and intrinsic poly-Si/SiOx contacts at different steps of the fabrication process. The excellent surface passivation properties obtained with the ex-situ doped poly-Si(B) contact (iVoc = 733 mV and J0 = 6.1 fA cm−2) attests to the good quality of this contact. We then propose further STEM, ECV and ToF-SIMS characterizations to assess: i) the evolution of the microstructure and B-doping profile through ex-situ doping and ii) the diffusion profile of hydrogen in the poly-Si contact. Our results show a gradual filling of the poly-Si layer with active B dopants with increasing annealing temperature (Ta), which strengthens the field-effect passivation and enables an iVoc increase after annealing up to 800 °C. We also observe a diffusion of O from the SiON:B doping layer to the interfacial SiOx layer during annealing, that likely enhances the passivation stability of our ex-situ doped poly-Si contact with increasing Ta. Finally, we conclude that the mechanism dominating the surface passivation changes during the fabrication process of the poly-Si/SiOx contact from field-effect passivation after annealing (performed for B-diffusion in the contact) to chemical passivation after following hydrogenation of the samples (performed by depositing a H-rich silicon nitride layer)