Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Zhao, Yifeng

  • Google
  • 7
  • 29
  • 163

Delft University of Technology

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2022The fundamental operation mechanisms of nc-SiOX≥0:H based tunnel recombination junctions revealed9citations
  • 2022Achieving 23.83% conversion efficiency in silicon heterojunction solar cell with ultra-thin MoOx hole collector layer via tailoring (i)a-Si:H/MoOx interface62citations
  • 2021Design and optimization of hole collectors based on nc-SiOx:H for high-efficiency silicon heterojunction solar cells34citations
  • 2020Copper-Plating Metallization With Alternative Seed Layers for c-Si Solar Cells Embedding Carrier-Selective Passivating Contacts23citations
  • 2020Realizing the Potential of RF-Sputtered Hydrogenated Fluorine-Doped Indium Oxide as an Electrode Material for Ultrathin SiO x/Poly-Si Passivating Contacts12citations
  • 2019High temperature oxidation pre-treatment of textured c-Si wafers passivated by a-Si:H1citations
  • 2019Effective Passivation of Black Silicon Surfaces via Plasma-Enhanced Chemical Vapor Deposition Grown Conformal Hydrogenated Amorphous Silicon Layer22citations

Places of action

Chart of shared publication
Procel, Paul
6 / 14 shared
Smets, Arno H. M.
1 / 1 shared
Parasramka, Harsh
1 / 2 shared
Vrijer, Thierry De
1 / 1 shared
Isabella, Olindo
7 / 18 shared
Nijen, David Van
1 / 1 shared
Cao, Liqi
1 / 1 shared
Tichelaar, F. D.
1 / 43 shared
Santbergen, Rudi
1 / 5 shared
Yan, Jin
1 / 2 shared
Yang, Guangtao
4 / 7 shared
Alcañiz Moya, Alba
1 / 2 shared
Mazzarella, Luana
6 / 9 shared
Özkol, Engin
2 / 2 shared
Han, Can
3 / 4 shared
Yao, Zhirong
1 / 1 shared
Zeman, Miro
6 / 21 shared
Weeber, Arthur
1 / 7 shared
Groot, Yvar De
1 / 1 shared
Kuler, Gerwin Van
1 / 1 shared
Limodio, Gianluca
2 / 2 shared
Zhang, Xiaodan
1 / 11 shared
Schut, Henk
1 / 3 shared
Eijt, Stephan
1 / 1 shared
Montes, Ana
1 / 2 shared
Dherouville, G.
1 / 1 shared
Yang, G.
1 / 9 shared
Medlin, Rostislav
1 / 1 shared
Šutta, Pavol
1 / 1 shared
Chart of publication period
2022
2021
2020
2019

Co-Authors (by relevance)

  • Procel, Paul
  • Smets, Arno H. M.
  • Parasramka, Harsh
  • Vrijer, Thierry De
  • Isabella, Olindo
  • Nijen, David Van
  • Cao, Liqi
  • Tichelaar, F. D.
  • Santbergen, Rudi
  • Yan, Jin
  • Yang, Guangtao
  • Alcañiz Moya, Alba
  • Mazzarella, Luana
  • Özkol, Engin
  • Han, Can
  • Yao, Zhirong
  • Zeman, Miro
  • Weeber, Arthur
  • Groot, Yvar De
  • Kuler, Gerwin Van
  • Limodio, Gianluca
  • Zhang, Xiaodan
  • Schut, Henk
  • Eijt, Stephan
  • Montes, Ana
  • Dherouville, G.
  • Yang, G.
  • Medlin, Rostislav
  • Šutta, Pavol
OrganizationsLocationPeople

article

Design and optimization of hole collectors based on nc-SiOx:H for high-efficiency silicon heterojunction solar cells

  • Procel, Paul
  • Zhao, Yifeng
  • Yang, Guangtao
  • Mazzarella, Luana
  • Weeber, Arthur
  • Isabella, Olindo
  • Han, Can
  • Zeman, Miro
Abstract

<p>Low activation energy (E<sub>a</sub>) and wide bandgap (E<sub>g</sub>) are essential for (p)-contacts to achieve effective hole collection in silicon heterojunction (SHJ) solar cells. In this work, we study Plasma-Enhanced Chemical Vapor Deposition p-type hydrogenated nanocrystalline silicon oxide, (p)nc-SiO<sub>x</sub>:H, combined with (p)nc-Si:H as (p)-contact in front/back-contacted SHJ solar cells. We firstly determine the effect of a plasma treatment at the (i)a-Si:H/(p)-contact interface on the thickness-dependent E<sub>a</sub> of (p)-contacts. Notably, when the (p)nc-Si:H layer is thinner than 20 nm, the E<sub>a</sub> decreases by applying a hydrogen plasma treatment and a very-high-frequency (i)nc-Si:H treatment. Such an interface treatment also significantly reduces the contact resistivity of the (p)-contact stacks (ρ<sub>c,p</sub>), resulting in an improvement of 6.1%<sub>abs</sub> in fill factor (FF) of the completed cells. Thinning down the (i)a-Si:H passivating layer to 5 nm leads to a low ρ<sub>c,p</sub> (144 mΩ⋅cm<sup>2</sup>) for (p)-contact stacks. Interestingly, we observe an increment of FF from 72.9% to 78.3% by using (p)nc-SiO<sub>x</sub>:H layers featuring larger differences between their optical gap (E<sub>04</sub>) and E<sub>a</sub>, which tend to enhance the built-in potential at the c-Si/(i)a-Si:H interface. Furthermore, we observe clear impacts on ρ<sub>c,p</sub>, open-circuit voltage, and FF by optimizing the thicknesses of (p)-contact that influence its E<sub>a</sub>. In front junction cells, the vertical and lateral collection of holes is affected by ρ<sub>c,p</sub> of (p)-contact stacks. This observation is also supported by TCAD simulations which reveal different components of lateral contributions. Lastly, we obtain both front and rear junction cells with certified FF well-above 80% and the best efficiency of 22.47%.</p>

Topics
  • impedance spectroscopy
  • resistivity
  • simulation
  • Hydrogen
  • Silicon
  • activation
  • chemical vapor deposition