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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Effenberger, Herta Silvia
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (5/5 displayed)
- 2012Phase equilibria and structural investigations in the Ni-poor part of the system Al-Ge-Nicitations
- 2011Phase equilibria and structural investigations in the system Al-Fe-Sicitations
- 2010Phase equilibria in the Al-Si-V systemcitations
- 2009Crystal structures, site occupations and phase equilibria in the system V-Zr-Gecitations
- 2009Synthesis of Single-Phase Sn3P4 by an isopiestic methodcitations
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article
Crystal structures, site occupations and phase equilibria in the system V-Zr-Ge
Abstract
The V-Zr-Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe (tI12, I4/mmm, CeScSi-type), VxZr5-xGe4 (oP36, Pnma, Sm5Ge4-type) and V4+xZr2-xGe5 (oI44, Ibam, Si5V6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, VxZr5-xGe4 (0.2 ? x ? 3.0) and V4+xZr2-xGe5 (0.06 ? x ? 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites.