Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2016Characterization of zinc oxide coated optical fiber long period gratings with improved refractive index sensing properties88citations
  • 2016Zinc oxide coated optical fiber long period gratings for sensing of volatile organic compounds10citations
  • 2016Zinc oxide coated optical fiber long period gratings for sensing of volatile organic compoundscitations
  • 2016Fabrication and Characterization of Metal Oxide-Coated Long-Period Fiber Gratings25citations
  • 2015Sensing Structure Based on Surface Plasmon Resonance in Chemically Etched Single Mode Optical Fibres68citations
  • 2014Enhanced refractive index sensing characteristics of optical fibre long period grating coated with titanium dioxide thin films92citations
  • 2013Sensing Structure based on Surface Plasmonic Resonance in Single Mode Optical Fibers Chemically Etched4citations
  • 2012Simultaneous measurement of partial pressure of O-2 and CO2 with a hybrid interferometer21citations

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Chart of shared publication
De Almeida, Jmmm
4 / 11 shared
Santos, Jl
7 / 42 shared
Santos, J. L.
1 / 1 shared
Coelho, L.
1 / 10 shared
Almeida, José Manuel Marques Martins De
1 / 3 shared
Marques Martins De Almeida, Jmmm
1 / 1 shared
Ferreira, Ras
2 / 3 shared
Andre, Ps
2 / 4 shared
Almeida, Jm
1 / 1 shared
Frazao, O.
1 / 57 shared
Kobelke, J.
1 / 7 shared
Schuster, K.
1 / 11 shared
Tafulo, Par
1 / 7 shared
Jorge, Pas
1 / 17 shared
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2015
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Co-Authors (by relevance)

  • De Almeida, Jmmm
  • Santos, Jl
  • Santos, J. L.
  • Coelho, L.
  • Almeida, José Manuel Marques Martins De
  • Marques Martins De Almeida, Jmmm
  • Ferreira, Ras
  • Andre, Ps
  • Almeida, Jm
  • Frazao, O.
  • Kobelke, J.
  • Schuster, K.
  • Tafulo, Par
  • Jorge, Pas
OrganizationsLocationPeople

article

Characterization of zinc oxide coated optical fiber long period gratings with improved refractive index sensing properties

  • De Almeida, Jmmm
  • Santos, Jl
  • Viegas, D.
Abstract

A fiber-optic refractive index (RI) sensor based on a long period fiber grating (LPFG) coated with a zinc oxide (ZnO) thin film was fabricated and characterized. A method to overcoat the LPFG's with a homogeneous ZnO thin films was developed. Characterization of ZnO thin films, deposited simultaneously on silicon (Si) planar substrates, was performed using Scanning Electron Microscope, Energy Dispersive X-ray Spectroscopy and X-ray Photoelectron Spectroscopy. The LPFGs with ZnO coatings from 29 to 145 nm of thickness were characterized and compared in terms of the wavelength shift and the intensity of the attenuation bands changing the surrounding refractive index (SRI) from 1.300 to 1.600. An average wavelength sensitivity of similar to 7162 nm/RIU was achieved in the RI range from 1.440 to 1.456 and more than 12,000 nm/RIU at 1.440 RI. Using a ZnO film thickness of 116 nm and in the RI region between 1.320 and 1.360 the average sensitivity of similar to 806 nm/RIU was measured for a 145 nm thick film. Working as an intensity sensing device, the 87 nm coated LPFG shows a linear sensitivity of 216.4 dB/RIU in a wide range of RI from 1.340 to 1.420.

Topics
  • thin film
  • x-ray photoelectron spectroscopy
  • zinc
  • Silicon
  • X-ray spectroscopy