Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Bid, Aveek

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (9/9 displayed)

  • 2022Observation of hidden electronic phases in 1T-TaS<SUB>2</SUB> through conductance fluctuation spectroscopycitations
  • 2022Observation of Quantum Griffith's singularity and anomalous metal in LaScO<SUB>3</SUB>/SrTiO<SUB>3</SUB> heterostructurecitations
  • 2022Temperature dependent cloaking of the Quantum Griffiths Singularity in LaScO$_3$/SrTiO$_3$ heterostructurescitations
  • 2019Resistance fluctuation spectroscopy of thin films of 3D topological insulator BiSbTeSe<SUB>1.6</SUB>5citations
  • 2018Strain-induced continuous transition from Weak localization regime to Strong localization regime in a doped Mott Insulatorcitations
  • 2017Effect of microstructure on the electronic transport properties of epitaxial CaRuO<SUB>3</SUB> thin films5citations
  • 2016Structural instability and phase co-existence driven non-Gaussian resistance fluctuations in metal nanowires at low temperatures1citations
  • 2014Probing a spin-glass state in SrRuO<SUB>3</SUB> thin films through higher-order statistics of resistance fluctuations12citations
  • 2005Experimental study of Rayleigh instability in metallic nanowires using resistance fluctuations measurements from 77K to 375K7citations

Places of action

Chart of shared publication
Kundu, Hemanta Kumar
3 / 3 shared
Sruthi, S.
1 / 1 shared
Bhotla, Prasad Vishnu
1 / 1 shared
Dogra, Anjana
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Kaur, Simrandeep
2 / 2 shared
Narayanan, Rajesh
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Kumar, Sumit
2 / 13 shared
Vojta, Thomas
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Mitra, Chiranjib
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Gopal, R. K.
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Kant, Raushan
1 / 1 shared
Singh, Sourabh
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Biswas, Sangram
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Daptary, Gopinath
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Bisht, Ravindra
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Raychaudhuri, Arup
1 / 1 shared
Sil, Anomitra
1 / 1 shared
Sow, Chanchal
2 / 5 shared
Daptary, Gopi Nath
2 / 2 shared
Kumar, P. S. Anil
2 / 4 shared
Chiniwar, Santosh
1 / 1 shared
Sarkar, Suman
1 / 2 shared
Raychaudhuri, A. K.
1 / 3 shared
Raychaudhuri, Arup K.
1 / 1 shared
Bora, Achyut
1 / 1 shared
Chart of publication period
2022
2019
2018
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2014
2005

Co-Authors (by relevance)

  • Kundu, Hemanta Kumar
  • Sruthi, S.
  • Bhotla, Prasad Vishnu
  • Dogra, Anjana
  • Kaur, Simrandeep
  • Narayanan, Rajesh
  • Kumar, Sumit
  • Vojta, Thomas
  • Mitra, Chiranjib
  • Gopal, R. K.
  • Kant, Raushan
  • Singh, Sourabh
  • Biswas, Sangram
  • Daptary, Gopinath
  • Bisht, Ravindra
  • Raychaudhuri, Arup
  • Sil, Anomitra
  • Sow, Chanchal
  • Daptary, Gopi Nath
  • Kumar, P. S. Anil
  • Chiniwar, Santosh
  • Sarkar, Suman
  • Raychaudhuri, A. K.
  • Raychaudhuri, Arup K.
  • Bora, Achyut
OrganizationsLocationPeople

article

Effect of microstructure on the electronic transport properties of epitaxial CaRuO<SUB>3</SUB> thin films

  • Sil, Anomitra
  • Sow, Chanchal
  • Bid, Aveek
  • Daptary, Gopi Nath
  • Kumar, P. S. Anil
  • Chiniwar, Santosh
  • Sarkar, Suman
Abstract

We have carried out extensive comparative studies of the structural and transport properties of CaRuO<SUB>3</SUB> thin films grown under various oxygen pressure. We find that the preferred orientation and surface roughness of the films are strongly affected by the oxygen partial pressure during growth. This in turn affects the electrical and magnetic properties of the films. Films grown under high oxygen pressure have the least surface roughness and show transport characteristics of a good metal down to the lowest temperature measured. On the other hand, films grown under low oxygen pressures have high degree of surface roughness and show signatures of ferromagnetism. We could verify that the low frequency resistance fluctuations (noise) in these films arise due to thermally activated fluctuations of local defects and that the defect density matches with the level of disorder seen in the films through structural characterizations....

Topics
  • density
  • microstructure
  • surface
  • thin film
  • Oxygen
  • defect