Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2015Spin-coatable, photopatternable magnetic nanocomposite thin films for MEMS device applications8citations
  • 2015Insight into the charge transport and degradation mechanisms in organic transistors operating at elevated temperatures in air13citations
  • 2015Source/drain engineering in OFETs using self assembled monolayers of metal complexed porphyrins4citations
  • 2013Anisotropic strain effect on electron transport in C60 organic field effect transistors3citations

Places of action

Chart of shared publication
Poddar, P.
1 / 1 shared
Tiwary, Nikhilendu
1 / 9 shared
Palaparthy, V.
1 / 1 shared
Sharan, C.
1 / 1 shared
Kandpal, M.
1 / 1 shared
Nigam, Akash
2 / 2 shared
Garg, Tarun
1 / 3 shared
Kabra, Dinesh
1 / 8 shared
Ravikanth, M.
1 / 1 shared
Satti, Sampath
1 / 1 shared
Lakshmi, V.
1 / 4 shared
Schwabegger, Giinther
1 / 1 shared
Simbrunner, Clemens
1 / 3 shared
Ahmed, Rizwan
1 / 1 shared
Ullah, Mujccb
1 / 1 shared
Sitter, Helmut
1 / 2 shared
Fishchuk, Ivan I.
1 / 1 shared
Kadashchuk, Andrey
1 / 2 shared
Chart of publication period
2015
2013

Co-Authors (by relevance)

  • Poddar, P.
  • Tiwary, Nikhilendu
  • Palaparthy, V.
  • Sharan, C.
  • Kandpal, M.
  • Nigam, Akash
  • Garg, Tarun
  • Kabra, Dinesh
  • Ravikanth, M.
  • Satti, Sampath
  • Lakshmi, V.
  • Schwabegger, Giinther
  • Simbrunner, Clemens
  • Ahmed, Rizwan
  • Ullah, Mujccb
  • Sitter, Helmut
  • Fishchuk, Ivan I.
  • Kadashchuk, Andrey
OrganizationsLocationPeople

article

Insight into the charge transport and degradation mechanisms in organic transistors operating at elevated temperatures in air

  • Nigam, Akash
  • Garg, Tarun
  • Kabra, Dinesh
  • Rao, V. Ramgopal
Abstract

Operational stability of organic devices at above-room-temperatures in ambient environment is of imminent practical importance. In this report, we have investigated the charge transport and degradation mechanisms in pentacene based organic field effect transistors (OFETs) operating in the temperatures ranging from 25 ºC to 150 ºC under ambient conditions. The thin film characterizations techniques (X-ray photoelectron spectroscopy, X-ray diffraction and atomic force microscopy) were used to establish the structural and chemical stability of pentacene thin films at temperatures up to 150 ºC in ambient conditions. The electrical behavior of OFETs varies differently in different temperature bracket. Mobility, at temperatures below 110 ºC, is found to be thermally activated in presence of traps and temperature independent in absence of traps. At temperatures above 110 ºC mobility degrades due to polymorphism in pentacene or interfacial properties. The degradation of mobility is compensated with the decrease in threshold voltage at high temperatures and OFETs are operational at temperatures as high as 190 ºC. 70 ºC has been identified as the optimum temperature of operation for our OFETs where both device behavior and material properties are stable enough to ensure sustainable performance.

Topics
  • impedance spectroscopy
  • mobility
  • x-ray diffraction
  • thin film
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • chemical stability
  • interfacial