Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2007TiO <SUB>2</SUB> thin films prepared by sol-gel method for waveguiding applications: Correlation between the structural and optical properties98citations

Places of action

Chart of shared publication
Mechiakh, R.
1 / 2 shared
Bensaha, R.
1 / 2 shared
Boudine, B.
1 / 3 shared
Boudrioua, A.
1 / 3 shared
Kremer, R.
1 / 2 shared
Chart of publication period
2007

Co-Authors (by relevance)

  • Mechiakh, R.
  • Bensaha, R.
  • Boudine, B.
  • Boudrioua, A.
  • Kremer, R.
OrganizationsLocationPeople

article

TiO <SUB>2</SUB> thin films prepared by sol-gel method for waveguiding applications: Correlation between the structural and optical properties

  • Mechiakh, R.
  • Meriche, F.
  • Bensaha, R.
  • Boudine, B.
  • Boudrioua, A.
  • Kremer, R.
Abstract

Thin films of transparent titanium oxide (TiO<SUB>2</SUB>) are prepared by the sol-gel dip-coating technique. Structural and optical properties of TiO<SUB>2</SUB> thin films are investigated for different annealing temperatures and different number of coatings. X-ray diffraction (XRD) and Raman spectroscopy analysis show that the anatase crystalline phase appears beyond 350 °C for the four layers TiO<SUB>2</SUB> film. At higher temperatures and for thicker films, we observe in addition to anatase the formation of brookite and rutile phases. The grain size calculated from XRD patterns increases as the temperature of annealing and number of dipping increase, from 11.9 to 17.1 nm for anatase and decreases as the number of dipping increases, from 24.2 to 10.2 nm for brookite. Film thickness, refractive index, and porosity are found to vary with treatment temperature and the number of coating. The obtained films are transparent in the visible range and opaque in the UV region. Waveguiding properties are studied using m-lines spectroscopy. The best results indicate that our films are monomodes TE<SUB>0</SUB> at 632.8 nm with optical losses of 2 dB cm<SUP>-1</SUP>. <P />...

Topics
  • grain
  • grain size
  • x-ray diffraction
  • thin film
  • crystalline phase
  • titanium
  • annealing
  • porosity
  • Raman spectroscopy