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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Payton, Oliver
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Topics
Publications (12/12 displayed)
- 2024Microstructural Analysis of Ex-Service Neutron Irradiated Stainless Steel Nuclear Fuel Cladding by High-Speed AFM
- 2021Sample Preparation Methods for Optimal HS-AFM Analysiscitations
- 2019A comparison of two high spatial resolution imaging techniques for determining carbide precipitate type and size in ferritic 9Cr-1Mo steelcitations
- 2019Development of Fatigue Testing System for in-situ Observation of Stainless Steel 316 by HS-AFM & SEMcitations
- 2018A study of dynamic nanoscale corrosion initiation events by HS-AFMcitations
- 2018Development of an adapted electrochemical noise technique for in-situ corrosion monitoring of spent nuclear fuel aqueous storage environments
- 2017Investigating corrosion using high-speed AFM
- 2017In situ imaging of corrosion processes in nuclear fuel claddingcitations
- 2017Ionic solutions of two-dimensional materialscitations
- 2016Structural effects in UO2 thin films irradiated with U ionscitations
- 2015Characterisation of electrodeposited polycrystalline uranium dioxide thin films on nickel foil for industrial applicationscitations
- 2015In situ imaging of corrosion processes in nuclear fuel cladding
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article
Structural effects in UO2 thin films irradiated with U ions
Abstract
This work presents the results of a detailed structural characterisation of irradiated and unirradiated single crystal thin films of UO<sub>2</sub>. Thin films of UO<sub>2</sub> were produced by reactive magnetron sputtering onto (001), (110) and (111) single crystal yttria-stabilised zirconia (YSZ) substrates. Half of the samples were irradiated with 110 MeV <sup>238</sup>U<sup>31+</sup> ions to fluences of 5 × 10<sup>10</sup>, 5 × 10<sup>11</sup> and 5 × 10<sup>12</sup> ions/cm<sup>2</sup> to induce radiation damage, with the remainder kept for reference measurements. It was observed that as-produced UO<sub>2</sub> films adopted the crystallographic orientation of their YSZ substrates. The irradiation fluences used in this study however, were not sufficient to cause any permanent change in the crystalline nature of UO<sub>2</sub>. Conversely, it has been demonstrated that the effect of epitaxial re-crystallisation of the induced radiation damage can be quantified in terms of kernel average misorientation (KAM). Thus, it has been shown that different crystallographic orientations of UO<sub>2</sub> respond differently to ion irradiation.