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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Springell, Ross
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Publications (6/6 displayed)
- 2024Polyepitaxial grain matching to study the oxidation of uranium dioxidecitations
- 2024Radiation Effects in Uranium Nitride and Zirconium Nitride
- 2019Comparing the corrosion of uranium nitride and uranium dioxide surfaces with H2O2citations
- 2018Chemistry and Corrosion in the irradiated cooling circuits of a prototype fusion power station
- 2016Structural effects in UO 2 thin films irradiated with U ionscitations
- 2016Structural effects in UO2 thin films irradiated with U ionscitations
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article
Structural effects in UO2 thin films irradiated with U ions
Abstract
This work presents the results of a detailed structural characterisation of irradiated and unirradiated single crystal thin films of UO<sub>2</sub>. Thin films of UO<sub>2</sub> were produced by reactive magnetron sputtering onto (001), (110) and (111) single crystal yttria-stabilised zirconia (YSZ) substrates. Half of the samples were irradiated with 110 MeV <sup>238</sup>U<sup>31+</sup> ions to fluences of 5 × 10<sup>10</sup>, 5 × 10<sup>11</sup> and 5 × 10<sup>12</sup> ions/cm<sup>2</sup> to induce radiation damage, with the remainder kept for reference measurements. It was observed that as-produced UO<sub>2</sub> films adopted the crystallographic orientation of their YSZ substrates. The irradiation fluences used in this study however, were not sufficient to cause any permanent change in the crystalline nature of UO<sub>2</sub>. Conversely, it has been demonstrated that the effect of epitaxial re-crystallisation of the induced radiation damage can be quantified in terms of kernel average misorientation (KAM). Thus, it has been shown that different crystallographic orientations of UO<sub>2</sub> respond differently to ion irradiation.