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Dunn, S. G.
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article
Formation and characterization of nanoparticles formed by sequential ion implantation of Au and Co into SiO2
Abstract
<p>Nanoparticles (NPs) were formed by sequential ion implantation of Au and Co into thin SiO<sub>2</sub>. After Au implantation and annealing, Co implantations were carried out at room temperature (RT) and 400 °C, respectively, with no subsequent annealing. The NPs were investigated by means of Rutherford backscattering spectroscopy (RBS), transmission electron microscopy (TEM) and extended X-ray absorption fine structure spectroscopy (EXAFS). TEM shows the formation of Co-Au core-shell NPs for the Co implantation at 400 °C. EXAFS measurements indicate significant strain in the NPs and a bond-length expansion of the Co-Co bonds in the NP core with a concomitant contraction of the Au-Au bonds in the Au shells. NPs are also observed by TEM for the Co implantation performed at RT, however, a lack of crystallinity is apparent from electron diffraction and EXAFS measurements.</p>