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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Cookson, D. J.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (7/7 displayed)
- 2010Swift-heavy-ion-induced damage formation in III-V binary and ternary semiconductorscitations
- 2007Modification of embedded Cu nanoparticlescitations
- 2007Synthesis and characterization of ion-implanted Pt nanocrystals in SiO2citations
- 2007Ion-irradiation-induced amorphization of Cu nanoparticles embedded in SiO2citations
- 2007Amorphization of embedded Cu nanocrystals by ion irradiationcitations
- 2006Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiationcitations
- 2006Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniquescitations
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article
Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques
Abstract
<p>Elemental Cu nanocrystals were synthesized in thin film SiO<sub>2</sub> by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m<sup>2</sup>.</p>