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Kozlov, Vasilij
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Degradation effects in TlBr single crystals under prolonged bias voltage
Abstract
Electrical properties of TlBr purified by hydrothermal annealing in pure water were studied by I-V, capacitance and photocurrent measurements using Ti-electrodes which were deposited by electron-beam evaporation. Time characteristics of the current during the aging were recorded under fixed voltage (0-200 V) at different temperatures 277-353 K. The samples were additionally characterised by the X-ray powder diffraction and rocking curve methods. The degradation of TlBr was studied by scanning electron microscopy (SEM) and energy dispersive X-ray spectrometry (EDS). The composition at the electrode area was observed to be different for the negative and positive sides. (C) 2007 Elsevier B.V. All rights reserved.