Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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693.932 PEOPLE
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693.932 People

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Naji, M.
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Trager-Cowan, Carol

  • Google
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University of Strathclyde

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (25/25 displayed)

  • 2022Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscopecitations
  • 2022Crystalline grain engineered CsPbIBr 2 films for indoor photovoltaics14citations
  • 2022Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics14citations
  • 2020Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope10citations
  • 2020Nanomechanical behaviour of individual phases in WC-Co cemented carbides, from ambient to high temperature29citations
  • 2020Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (112ˉ0) GaNcitations
  • 2020Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope3citations
  • 2020Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates3citations
  • 2020Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN4citations
  • 2018Dislocation contrast in electron channelling contrast images as projections of strain-like components9citations
  • 2017Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction21citations
  • 2017Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction21citations
  • 2017Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.5611citations
  • 2017Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films51citations
  • 2017Exploring transmission Kikuchi diffraction using a Timepix detector10citations
  • 2016Reprint ofcitations
  • 2016Optical and structural properties of GaN epitaxial layers on LiAlO2 substrates and their correlation with basal-plane stacking faults4citations
  • 2016Electron channelling contrast imaging for III-nitride thin film structures21citations
  • 2015Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns51citations
  • 2013Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope15citations
  • 2012Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope17citations
  • 2008Rare earth doping of III-nitride alloys by ion implantation8citations
  • 2004Development of CdSSe/CdS VCSELs for application to laser cathode ray tubescitations
  • 2002Structural and optical properties of InGaN/GaN layers close to the critical layer thickness95citations
  • 2001Compositional pulling effects in InxGa1_xN/GaN layers186citations

Places of action

Chart of shared publication
Jiu, Ling
5 / 5 shared
Nouf-Allehiani, M.
3 / 5 shared
Winkelmann, A.
5 / 13 shared
Naresh-Kumar, G.
14 / 18 shared
Bruckbauer, Jochen
11 / 12 shared
Vespucci, S.
3 / 4 shared
Martin, Robert W.
2 / 11 shared
Ghosh, Paheli
2 / 10 shared
Krishnan Jagadamma, Lethy
1 / 19 shared
Jagadamma, Lethy Krishnan
1 / 21 shared
Edwards, Paul
8 / 22 shared
Martin, Robert
8 / 35 shared
Mingard, K.
3 / 5 shared
Luca, F. De
1 / 2 shared
Gee, M. G.
1 / 1 shared
Zhang, H.
1 / 92 shared
Stewart, M.
1 / 26 shared
Jablon, B. M.
1 / 1 shared
Thonke, Klaus
3 / 7 shared
Gong, Yipin
3 / 3 shared
Ipsen, Anja
3 / 3 shared
Müller, Raphael
3 / 4 shared
Bai, Jie
4 / 5 shared
Bauer, Sebastian
3 / 4 shared
Wang, Tao
4 / 18 shared
Wallace, Michael J.
2 / 2 shared
Mingard, K. P.
2 / 2 shared
Kusch, Gunnar
1 / 20 shared
Alasmari, Aeshah Mushabbab A.
1 / 1 shared
Wallace, Michael
1 / 2 shared
Hourahine, Benjamin
6 / 14 shared
Zhao, Xunming
1 / 1 shared
Yu, Xiang
1 / 5 shared
Winkelmann, Aimo
2 / 6 shared
Hocker, Matthias
1 / 2 shared
Vennéguès, Philippe
1 / 9 shared
Pascal, Elena
1 / 1 shared
Nagarajan, S.
1 / 6 shared
Vilalta-Clemente, A.
4 / 9 shared
Nolze, Gert
1 / 35 shared
Wilkinson, A. J.
3 / 12 shared
Vespucci, Stefano
3 / 3 shared
Jussila, H.
2 / 4 shared
Nolze, G.
1 / 2 shared
Naresh-Kumar, Gunasekar
1 / 1 shared
Subramaniyam, Nagarajan
1 / 1 shared
Warzecha, Monika
1 / 2 shared
Li, Zhi
1 / 10 shared
Gamarra, P.
2 / 4 shared
Forte-Poisson, M. A. Di
2 / 2 shared
S., A. Allehiani Nouf Mohammad
2 / 2 shared
Oshea, V.
2 / 7 shared
Maneuski, D.
2 / 2 shared
Thomson, Derek
1 / 1 shared
Lutsenko, E. V.
1 / 1 shared
Rzheutski, M. V.
1 / 1 shared
Pavlovskii, V. N.
1 / 1 shared
Yablonskii, G. P.
1 / 1 shared
Vescan, A.
2 / 4 shared
Heuken, M.
2 / 6 shared
Reuters, B.
1 / 1 shared
Alanzi, M.
1 / 1 shared
Hamidalddin, A.
1 / 1 shared
Kalisch, H.
2 / 4 shared
Mauder, C.
2 / 2 shared
Alyamani, A.
1 / 2 shared
Thomson, David
1 / 8 shared
Day, A. P.
3 / 3 shared
Trampert, A.
1 / 17 shared
Kraeusel, Simon
1 / 1 shared
Wang, K. R.
1 / 1 shared
Giesen, C.
1 / 3 shared
Parbrook, P. J.
1 / 3 shared
Lacam, C.
1 / 2 shared
Ruterana, P.
1 / 15 shared
England, G.
1 / 1 shared
Tordjman, M.
1 / 1 shared
Lorenz, K.
1 / 23 shared
Roqan, I. S.
1 / 3 shared
Watson, Ian
1 / 20 shared
Odonnell, Kevin
4 / 15 shared
Alves, E.
3 / 129 shared
Jitov, V. A.
1 / 1 shared
Zakharov, L. Yu
1 / 1 shared
Yakushcheva, G. G.
1 / 1 shared
Sweeney, F.
2 / 8 shared
Kozlovsky, V. I.
1 / 1 shared
Kutzenov, P. I.
1 / 1 shared
Bondarev, V. Yu
1 / 1 shared
Sannikov, D. A.
1 / 1 shared
Pereira, Sergio Manuel De Sousa
1 / 1 shared
Pereira, Eduarda
1 / 3 shared
Correia, M. R.
2 / 10 shared
Franco, N.
1 / 16 shared
Sequeira, A. D.
1 / 2 shared
Sweeney, Francis
1 / 3 shared
Pereira, E.
1 / 6 shared
Pereira, S.
1 / 12 shared
Chart of publication period
2022
2020
2018
2017
2016
2015
2013
2012
2008
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2002
2001

Co-Authors (by relevance)

  • Jiu, Ling
  • Nouf-Allehiani, M.
  • Winkelmann, A.
  • Naresh-Kumar, G.
  • Bruckbauer, Jochen
  • Vespucci, S.
  • Martin, Robert W.
  • Ghosh, Paheli
  • Krishnan Jagadamma, Lethy
  • Jagadamma, Lethy Krishnan
  • Edwards, Paul
  • Martin, Robert
  • Mingard, K.
  • Luca, F. De
  • Gee, M. G.
  • Zhang, H.
  • Stewart, M.
  • Jablon, B. M.
  • Thonke, Klaus
  • Gong, Yipin
  • Ipsen, Anja
  • Müller, Raphael
  • Bai, Jie
  • Bauer, Sebastian
  • Wang, Tao
  • Wallace, Michael J.
  • Mingard, K. P.
  • Kusch, Gunnar
  • Alasmari, Aeshah Mushabbab A.
  • Wallace, Michael
  • Hourahine, Benjamin
  • Zhao, Xunming
  • Yu, Xiang
  • Winkelmann, Aimo
  • Hocker, Matthias
  • Vennéguès, Philippe
  • Pascal, Elena
  • Nagarajan, S.
  • Vilalta-Clemente, A.
  • Nolze, Gert
  • Wilkinson, A. J.
  • Vespucci, Stefano
  • Jussila, H.
  • Nolze, G.
  • Naresh-Kumar, Gunasekar
  • Subramaniyam, Nagarajan
  • Warzecha, Monika
  • Li, Zhi
  • Gamarra, P.
  • Forte-Poisson, M. A. Di
  • S., A. Allehiani Nouf Mohammad
  • Oshea, V.
  • Maneuski, D.
  • Thomson, Derek
  • Lutsenko, E. V.
  • Rzheutski, M. V.
  • Pavlovskii, V. N.
  • Yablonskii, G. P.
  • Vescan, A.
  • Heuken, M.
  • Reuters, B.
  • Alanzi, M.
  • Hamidalddin, A.
  • Kalisch, H.
  • Mauder, C.
  • Alyamani, A.
  • Thomson, David
  • Day, A. P.
  • Trampert, A.
  • Kraeusel, Simon
  • Wang, K. R.
  • Giesen, C.
  • Parbrook, P. J.
  • Lacam, C.
  • Ruterana, P.
  • England, G.
  • Tordjman, M.
  • Lorenz, K.
  • Roqan, I. S.
  • Watson, Ian
  • Odonnell, Kevin
  • Alves, E.
  • Jitov, V. A.
  • Zakharov, L. Yu
  • Yakushcheva, G. G.
  • Sweeney, F.
  • Kozlovsky, V. I.
  • Kutzenov, P. I.
  • Bondarev, V. Yu
  • Sannikov, D. A.
  • Pereira, Sergio Manuel De Sousa
  • Pereira, Eduarda
  • Correia, M. R.
  • Franco, N.
  • Sequeira, A. D.
  • Sweeney, Francis
  • Pereira, E.
  • Pereira, S.
OrganizationsLocationPeople

article

Reprint of

  • Hourahine, Benjamin
  • Nouf-Allehiani, M.
  • Thomson, Derek
  • Trager-Cowan, Carol
  • Bruckbauer, Jochen
  • Edwards, Paul
  • Martin, Robert
  • Naresh-Kumar, G.
Abstract

<p>Electron channelling contrast imaging (ECCI) performed in a scanning electron microscope (SEM) is a rapid and non-destructive structural characterisation technique for imaging, identifying and quantifying extended defects in crystalline materials. In this review, we will demonstrate the application of ECCI to the characterisation of III-nitride semiconductor thin films grown on different substrates and with different crystal orientations. We will briefly describe the history and the theory behind electron channelling and the experimental setup and conditions required to perform ECCI. We will discuss the advantages of using ECCI, especially in combination with other SEM based techniques, such as cathodoluminescence imaging. The challenges in using ECCI are also briefly discussed.</p>

Topics
  • impedance spectroscopy
  • scanning electron microscopy
  • theory
  • thin film
  • semiconductor
  • nitride
  • defect