Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Aalborg University

in Cooperation with on an Cooperation-Score of 37%

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Publications (20/20 displayed)

  • 2024Thermal cycling characterization of an integrated low-inductance GaN eHEMT power modulecitations
  • 2024Thermal cycling characterization of an integrated low-inductance GaN eHEMT power modulecitations
  • 2023Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors2citations
  • 2023Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors2citations
  • 2021Performance evaluation of lithium-ion batteries (LiFePO 4 cathode) from novel perspectives using a new figure of merit, temperature distribution analysis, and cell package analysis11citations
  • 2021Performance evaluation of lithium-ion batteries (LiFePO4 cathode) from novel perspectives using a new figure of merit, temperature distribution analysis, and cell package analysis11citations
  • 2020Parametric transformer using PM-inductors with saturation-gap1citations
  • 2018Frequency domain scanning acoustic microscopy for power electronics:Physics-based feature identification and selectivity7citations
  • 2018Frequency domain scanning acoustic microscopy for power electronics7citations
  • 2017Short-Circuit Degradation of 10-kV 10-A SiC MOSFET64citations
  • 2015Ageing monitoring in IGBT module under sinusoidal loading10citations
  • 2014A tapped-inductor buck-boost converter for a multi-DEAP generator energy harvesting system3citations
  • 2014A tapped-inductor buck-boost converter for a multi-DEAP generator energy harvesting system3citations
  • 2014A Tapped-Inductor Buck-Boost Converter for a Dielectric ElectroActive Polymer Generator8citations
  • 2014A Tapped-Inductor Buck-Boost Converter for a Dielectric ElectroActive Polymer Generator8citations
  • 2013An electromechanical model for a dielectric electroactive polymer generator2citations
  • 2013An Electromechanical Model of a Dielectric ElectroActive Polymer Generator2citations
  • 2013An Electromechanical Model of a Dielectric ElectroActive Polymer Generator2citations
  • 2012Energy Harvesting Cycles of Dielectric ElectroActive Polymer Generators8citations
  • 2012Energy Harvesting Cycles of Dielectric ElectroActive Polymer Generators8citations

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Co-Authors (by relevance)

  • Guo, Wendi
  • Takahashi, Masaki
  • Sun, Zhongchao
  • Jørgensen, Asger Bjørn
  • Bjørn Jørgensen, Asger
  • Iannuzzo, Francesco
  • Bęczkowski, Szymon
  • Baker, Nick
  • Jorgensen, Asger Bjorn
  • Beczkowski, Szymon
  • Knap, Vaclav
  • Song, Sungyoung
  • Uhrenfeldt, Christian
  • Rannestad, Bjørn
  • Aguilar, Andres Revilla
  • Julsgaard, Brian
  • Teodorescu, Remus
  • Sabri, Shadi
  • Hull, Brett
  • Vanbrunt, Edward
  • Juluri, Raghavendra Rao
  • Kerekes, Tamas
  • Grider, David
  • Eni, Emanuel-Petre
  • Pedersen, Kristian Bonderup
  • Ghimire, Pramod
  • Dimopoulos, Emmanouil
  • Willatzen, Morten
  • Trintis, Ionut
  • Rechenbach, Björn
  • Lassen, Benny
OrganizationsLocationPeople

article

Ageing monitoring in IGBT module under sinusoidal loading

  • Pedersen, Kristian Bonderup
  • Rannestad, Bjørn
  • Ghimire, Pramod
  • Munk-Nielsen, Stig
Abstract

This paper presents monitoring of ageing in high power insulated gate bipolar transistor (IGBT) modules subjected to sinusoidal loading at nominal power level. On-state voltage for IGBT, diode, and rise in interconnection resistance are used as ageing parameters. These are measured in three different ways: calibration of power modules after 24 h of operation, offline characterization every 5 min of operation, and continuous measurement during normal converter operation. Four power modules are tested, which are cycled to different degradation levels by number of cycles, where one is tested until failure. The characterization at different stages of lifetime indicates that the rise in resistance originates from thermo-mechanical degradation of interconnects. Post-test investigations: four-point probing and micro-sectioning indicate thermo-mechanical induced degradation of the chip topside interconnects as the source for rise in resistance. Major degradations are observed in bond wires and metallization on the low side diode.

Topics
  • impedance spectroscopy
  • aging
  • wire
  • sectioning