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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Amalu, Dr Emeka
Teesside University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (19/19 displayed)
- 2024Mineral wastescitations
- 2024Effect of Creep, Fatigue and Random Vibration on the Integrity of Solder Joints in BGA Packagecitations
- 2024Critical methods of geopolymer feedstocks activation for suitable industrial applicationscitations
- 2024Critical solder joint in insulated gate bipolar transistors (IGBT) power module for improved mechanical reliabilitycitations
- 2023Characterising Solder Materials from Random Vibration Response of Their Interconnects in BGA Packagingcitations
- 2023Effects of Reflow Profile and Miniaturisation on the Integrity of Solder Joints in Surface Mount Chip Resistorscitations
- 2021Thermal fatigue life of ball grid array (BGA) solder joints made from different alloy compositionscitations
- 2020Comparing and benchmarking fatigue behaviours of various SAC solders under thermo-mechanical loadingcitations
- 2019Creep damage of BGA solder interconnects subjected to thermal cycling and isothermal ageingcitations
- 20193D printing of intricate sand cores for complex copper castings
- 2018Effect of Temperature on Conductivity of PLA-Carbon 3D Printed Components.
- 2016Effects of component stand-off height on reliability of solder joints in assembled electronic component
- 2015Effect of intermetallic compounds on thermo-mechanical reliability of lead-free solder joints in solar cell assembly
- 2015A review of interconnection technologies for improved crystalline silicon solar cell photovoltaic module assemblycitations
- 2012High-temperature fatigue life of flip chip lead-free solder joints at varying component stand-off heightcitations
- 2012High temperature reliability of lead-free solder joints in a flip chip assemblycitations
- 2012Thermal management materials for electronic control unitcitations
- 2012Prediction of damage and fatigue life of high-temperature flip chip assembly interconnections at operationscitations
- 2011Effect of solder joint integrity on the thermal performance of a TEC for a 980nm pump laser module
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article
High-temperature fatigue life of flip chip lead-free solder joints at varying component stand-off height
Abstract
The recent uses of microelectronics as sensors or control devices at high-temperature ambient increase the rate of visco-plastic degradation of solder joints of their components. The response of solder bumped joints to the induced thermal load culminates in plastic strain which over many cycles may accumulate damage in the joints, subsequently leading to their fatigue failures. Finite element modelling is employed to investigate the impact of static structural factors of flip chip (FC) assembly on its solder joint damage at high-temperature excursions. This paper discusses results of a modelling study focused on effects of component stand-off height (CSH) and intermetallic compound (IMC) on static structural integrity of lead-free solder joints in a flip chip FC48D6.3C457 package which is cycled between −38 °C and 157 °C temperatures. The result analysis is based on accumulation of damage indicators such as stress, strain and plastic work density in the solder joints. The accumulated damage was used to predict the thermo-fatigue life of different architectures of the FC assembly. It was found that the fatigue life of the joint assemblies decrease exponentially as the component stand-off height decreases in a cubic function. Based on our research results, it is proposed that the size of diameter of bond pad defined by solder mask on printed circuit board (PCB) should not exceed 110% of the size of diameter of bond pad at the chip side.