Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2009Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers98citations

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Vuorinen, Vesa
1 / 48 shared
Kivilahti, Jorma
1 / 7 shared
Laurila, Tomi
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2009

Co-Authors (by relevance)

  • Vuorinen, Vesa
  • Kivilahti, Jorma
  • Laurila, Tomi
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article

Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers

  • Vuorinen, Vesa
  • Hurtig, Johannes
  • Kivilahti, Jorma
  • Laurila, Tomi
Abstract

<p>The effect of Ag, Fe, Au and Ni on the interfacial reactions between Sn-based solder and Cu substrate has been investigated in this paper. Based on the solubility of the alloying elements in the Sn-Cu intermetallic compound (IMC) layers these elements can be divided into two categories: (i) alloying elements that do not dissolve significantly in either Cu<sub>6</sub>Sn<sub>5</sub> or Cu<sub>3</sub>Sn and (ii) elements that exhibit significant solubility in Cu<sub>6</sub>Sn<sub>5</sub> and also to Cu<sub>3</sub>Sn. It is shown that the latter group of elements have stronger effect on the growth behaviour of IMC's in the Sn-Cu system than those belonging to the first group. Of the investigated elements Ni had the most prominent effect on the growth kinetics. It reduced greatly the thickness of Cu<sub>3</sub>Sn and consequently also the total IMC layer thickness. Au had similar but markedly weaker effect. On the contrary, Fe and Ag only slightly decreased the total IMC layer thickness, and more importantly did not change the thickness ratio of Cu<sub>6</sub>Sn<sub>5</sub> to Cu<sub>3</sub>Sn in comparison to the pure Sn-Cu system.</p>

Topics
  • impedance spectroscopy
  • compound
  • intermetallic
  • interfacial