Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Pshyk, Oleksander

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2020Stabilization of complex orthorhombic o-Cr3C2 thin films under high energetic growth conditions: Experiments and calculations4citations
  • 2019Low-temperature growth of epitaxial Ti <inf>2</inf> AlC MAX phase thin films by low-rate layer-by-layer PVD24citations
  • 2018Structural and mechanical characterization of (TiZrNbHfTa)N/WN multilayered nitride coatings46citations
  • 2018Microstructure, phase composition and mechanical properties of novel nanocomposite (TiAlSiY)N and nano-scale (TiAlSiY)N/MoN multifunctional heterostructures17citations
  • 2018A new type of (TiZrNbTaHf)N/MoN nanocomposite coating: Microstructure and properties depending on energy of incident ions78citations

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Chart of shared publication
Lousa, Arturo
1 / 1 shared
Emerson Coy, Phd, Dsc.
1 / 38 shared
Esteve, Joan
1 / 1 shared
Ivashchenko, Volodymyr I.
1 / 2 shared
Martínez-De-Olcoz, Leyre
1 / 1 shared
Yate, Luis
1 / 17 shared
Scheibe, Błażej
1 / 4 shared
Jurga, Stefan
4 / 59 shared
Kempiński, Mateusz
4 / 11 shared
Romero, Luis Emerson Coy
4 / 35 shared
Pogrebnjak, Alexander D.
3 / 9 shared
Bagdasaryan, Artem A.
2 / 3 shared
Beresnev, Vyacheslav M.
2 / 6 shared
Kravchenko, Yaroslav
1 / 1 shared
Iatsunskyi, Igor
1 / 59 shared
Załęski, Karol
1 / 41 shared
Mediukh, Nazarii R.
1 / 1 shared
Ivashchenko, Volodymyr
1 / 5 shared
Konarski, Piotr
1 / 10 shared
Misnik, Maciej
1 / 1 shared
Chart of publication period
2020
2019
2018

Co-Authors (by relevance)

  • Lousa, Arturo
  • Emerson Coy, Phd, Dsc.
  • Esteve, Joan
  • Ivashchenko, Volodymyr I.
  • Martínez-De-Olcoz, Leyre
  • Yate, Luis
  • Scheibe, Błażej
  • Jurga, Stefan
  • Kempiński, Mateusz
  • Romero, Luis Emerson Coy
  • Pogrebnjak, Alexander D.
  • Bagdasaryan, Artem A.
  • Beresnev, Vyacheslav M.
  • Kravchenko, Yaroslav
  • Iatsunskyi, Igor
  • Załęski, Karol
  • Mediukh, Nazarii R.
  • Ivashchenko, Volodymyr
  • Konarski, Piotr
  • Misnik, Maciej
OrganizationsLocationPeople

article

Structural and mechanical characterization of (TiZrNbHfTa)N/WN multilayered nitride coatings

  • Pogrebnjak, Alexander D.
  • Jurga, Stefan
  • Bagdasaryan, Artem A.
  • Pshyk, Oleksander
  • Beresnev, Vyacheslav M.
  • Kempiński, Mateusz
  • Romero, Luis Emerson Coy
Abstract

<p>The (TiZrNbHfTa)N/WN multicomponent coatings were deposited by vacuum arc evaporation under different substrate bias (−90 and −280 V). X-ray photoelectron spectroscopy was used for analyzing of complex composition of investigated coatings by reflecting of atomic scale chemical interactions. The structural investigations showed the formation of a simple disordered solid solution in (TiZrNbHfTa)N layer, β-W<sub>2</sub>N phase in WN layer with fcc crystal structure and highly disordered bcc (1 1 0) and (2 2 0)-oriented high-entropy alloy phases, regardless of the applied bias potential. It was shown that with increasing of substrate bias from −90 to −280 V, there is a slight decrease of hardness from 34 to 31 GPa and increase of Young's modulus from 325 to 337 GPa, which can be explained by annihilation of point defects and precipitation of relatively softer metallic phase.</p>

Topics
  • impedance spectroscopy
  • phase
  • x-ray photoelectron spectroscopy
  • nitride
  • hardness
  • precipitation
  • evaporation
  • point defect