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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Smith, James
University of East Anglia
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (7/7 displayed)
- 2024Understanding the interplay of Zn vapours and formation of intermetallic compounds during remote laser welding of Zn-coated steel to aluminium in a zero-gap lap joint configurationcitations
- 2023Mixed Potential Electrochemical Sensors for Natural Gas Leak Detection – Field Testing of Portable Sensor Package
- 2022Quantifiable correlation of ToF‐SIMS and XPS data from polymer surfaces with controlled amino acid and peptide contentcitations
- 2020Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivitycitations
- 2020Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivitycitations
- 2012Electrochemically controlled release of antischistosomiasis agents from polypyrrolecitations
- 2011Recent applications of SEM and AFM for assessing topography of metal and related coatingscitations
Places of action
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article
Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivity
Abstract
Low resistivity (ρ~3-24 mΩ.cm) with tunable n- and p-type single phase Cu2O thin films have been grown by pulsed laser deposition at 25-200 0C by varying the background oxygen partial pressure (O2pp). Capacitance data obtained by electrochemical impedance spectroscopy was used to determine the conductivity (n- or p-type), carrier density, and flat band potentials for samples grown on indium tin oxide (ITO) at 25 0C. The Hall mobility (µH) of the n- and p-type Cu2O was estimated to be ~ 0.85 cm 2.V-1-1 and ~ 4.78 cm 2.V-1s-1 respectively for samples grown on quartz substrate at 25 0C. An elevated substrate temperature ~ 200 0C with O2pp = 2 - 3 mTorr yielded p-type Cu2O films with six orders of magnitude higher resistivities in the range, ρ ~ 9 - 49 kΩ.cm and mobilities in the range, µH ~13.5 - 22.2 cm 2.V-1s-1. UV-Vis-NIR diffuse reflectance spectroscopy showed optical bandgaps of Cu2O films in the range of 1.76 to 2.15 eV depending on O2pp. Thin films grown at oxygen rich conditions O2pp ≥ 7 mTorr yielded mixed phase copper oxide irrespective of the substrate temperatures and upon air annealing at 550 0C for 1 hour completely converted to CuO phase with n-type semiconducting properties (ρ~12 Ω.cm, µH ~1.50 cm2V-1s-1). The as-grown p- and n-type Cu2O showed rectification and a photovoltaic response in solid junctions with n-ZnO and p-Si electrodes respectively. Our findings may create new opportunities for devising Cu2O based junctions requiring low process temperatures.