Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Smith, James

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University of East Anglia

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2024Understanding the interplay of Zn vapours and formation of intermetallic compounds during remote laser welding of Zn-coated steel to aluminium in a zero-gap lap joint configuration1citations
  • 2023Mixed Potential Electrochemical Sensors for Natural Gas Leak Detection – Field Testing of Portable Sensor Packagecitations
  • 2022Quantifiable correlation of ToF‐SIMS and XPS data from polymer surfaces with controlled amino acid and peptide content3citations
  • 2020Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivity61citations
  • 2020Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivity61citations
  • 2012Electrochemically controlled release of antischistosomiasis agents from polypyrrole18citations
  • 2011Recent applications of SEM and AFM for assessing topography of metal and related coatings20citations

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Ceglarek, Darek
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Jabar, Sharhid
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Franciosa, Pasquale
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Baghbani Barenji, Ali
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Kotadia, Hirenkumar
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Ayarkwa, Kwasi
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Agi, Kamil
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Ian, Robert
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Scurr, David J.
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Chan, Weng C.
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Denning, Chris
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Genapathy, Sivaneswary
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Alexander, Morgan R.
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Taylor, Michael
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Farhad, Dr. Syed Farid Uddin
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Fermín, David J.
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Cherns, David
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Fox, Neil A.
1 / 14 shared
Farhad, Syed Farid Uddin
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Fox, Neil
1 / 3 shared
Fermin, David
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Ewen, R.
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Campbell, S.
2 / 8 shared
Li, Y.
1 / 95 shared
Larson, C.
1 / 2 shared
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2012
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Co-Authors (by relevance)

  • Ceglarek, Darek
  • Jabar, Sharhid
  • Franciosa, Pasquale
  • Baghbani Barenji, Ali
  • Kotadia, Hirenkumar
  • Ayarkwa, Kwasi
  • Agi, Kamil
  • Garzon, Fernando H.
  • Ian, Robert
  • Halley, Sleight
  • Steven, Rory T.
  • Shard, Alexander G.
  • Spencer, Steve J.
  • Lledos, Marina
  • Scurr, David J.
  • Chan, Weng C.
  • Simoes, Fabio
  • Zelzer, Mischa
  • Denning, Chris
  • Genapathy, Sivaneswary
  • Alexander, Morgan R.
  • Canning, Anne
  • Taylor, Michael
  • Farhad, Dr. Syed Farid Uddin
  • Fermín, David J.
  • Cherns, David
  • Fox, Neil A.
  • Farhad, Syed Farid Uddin
  • Fox, Neil
  • Fermin, David
  • Ewen, R.
  • Campbell, S.
  • Li, Y.
  • Larson, C.
OrganizationsLocationPeople

article

Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivity

  • Farhad, Dr. Syed Farid Uddin
  • Smith, James
  • Fermín, David J.
  • Cherns, David
  • Fox, Neil A.
Abstract

Low resistivity (ρ~3-24 mΩ.cm) with tunable n- and p-type single phase Cu2O thin films have been grown by pulsed laser deposition at 25-200 0C by varying the background oxygen partial pressure (O2pp). Capacitance data obtained by electrochemical impedance spectroscopy was used to determine the conductivity (n- or p-type), carrier density, and flat band potentials for samples grown on indium tin oxide (ITO) at 25 0C. The Hall mobility (µH) of the n- and p-type Cu2O was estimated to be ~ 0.85 cm 2.V-1-1 and ~ 4.78 cm 2.V-1s-1 respectively for samples grown on quartz substrate at 25 0C. An elevated substrate temperature ~ 200 0C with O2pp = 2 - 3 mTorr yielded p-type Cu2O films with six orders of magnitude higher resistivities in the range, ρ ~ 9 - 49 kΩ.cm and mobilities in the range, µH ~13.5 - 22.2 cm 2.V-1s-1. UV-Vis-NIR diffuse reflectance spectroscopy showed optical bandgaps of Cu2O films in the range of 1.76 to 2.15 eV depending on O2pp. Thin films grown at oxygen rich conditions O2pp ≥ 7 mTorr yielded mixed phase copper oxide irrespective of the substrate temperatures and upon air annealing at 550 0C for 1 hour completely converted to CuO phase with n-type semiconducting properties (ρ~12 Ω.cm, µH ~1.50 cm2V-1s-1). The as-grown p- and n-type Cu2O showed rectification and a photovoltaic response in solid junctions with n-ZnO and p-Si electrodes respectively. Our findings may create new opportunities for devising Cu2O based junctions requiring low process temperatures.

Topics
  • density
  • impedance spectroscopy
  • resistivity
  • phase
  • mobility
  • thin film
  • Oxygen
  • copper
  • annealing
  • tin
  • pulsed laser deposition
  • Indium