| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Sebastiani, M.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2024Advanced microstructural characterization in high-strength steels via machine learning-enhanced high-speed nanoindentation and EBSD mappingcitations
- 2019A review of experimental approaches to fracture toughness evaluation at the micro-scalecitations
- 2018Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysiscitations
- 2016Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scalecitations
- 2016On the measurement and interpretation of residual stress at the micro-scalecitations
- 2016Effect of elastic anisotropy on strain relief and residual stress determination in cubic systems by FIB-DIC experimentscitations
- 2016Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlationcitations
- 2016A critical comparison between XRD and FIB residual stressmeasurement techniques in thin filmscitations
- 2014Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scalecitations
- 2014A critical comparison between XRD and FIB residual stress measurement techniques in thin filmscitations
- 2012Kircherite, a new mineral of the cancrinite-sodalite group with a 36-layer stacking sequence : occurrence and crystal structurecitations
- 2012Kircherite, a new mineral of the cancrinite-sodalite group with a 36-layer stacking sequence: Occurrence and crystal structure.citations
- 2012High resolution residual stress measurement on amorphous and crystalline plasma-sprayed single-splatscitations
- 2010Fantappièite, a new mineral of the cancrinite-sodalite group with a 33-layer stacking sequence : occurrence and crystal structurecitations
- 2010Kircherite, a new mineral of the cancrinite‐sodalite group with a 36‐layer stacking sequence: occurrence and crystal structure.
- 2010Fantappièite, a new mineral of the cancrinite - sodalite group with a 33-layer stacking sequence: occurrence and crystal structurecitations
- 2010A New Methodology For In-Situ Residual Stress Measurement In MEMS Structures
- 2009Preparation and mechanical characterization of dense and porous zirconia produced by gel casting with gelatin as a gelling agentcitations
Places of action
| Organizations | Location | People |
|---|
article
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
Abstract
Residual stresses play a crucial role in determining material properties and behaviour, in terms of structural integrity under monotonic and cyclic loading, and for functional performance, in terms of capacitance, conductivity, band gap, and other characteristics. The methods for experimental residual stress analysis at the macro- and micro-scales are well established, but residual stress evaluation at the nanoscale faces major challenges, e.g. the need for sample sectioning to prepare thin lamellae, by its very nature introducing major modifications to the quantity being evaluated.<br/><br/>Residual stress analysis by micro-ring core Focused Ion Beam milling directly at sample surface offers lateral resolution better than 1 μm, and encodes information about residual stress depth variation. We report a new method for residual stress depth profiling at the resolution better than 50 nm by the application of a mathematically straightforward and robust approach based on the concept of eigenstrain. The results are validated by direct comparison with measurements by nano-focus synchrotron X-ray diffraction.