| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Bemporad, E.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (20/20 displayed)
- 2024The effect of ceramic YSZ powder morphology on coating performance for industrial TBCscitations
- 2022Basaltic Glass Fibers from Industrial Wastes: A Laboratory-Scale Technical Feasibility Studycitations
- 2018Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysiscitations
- 2016Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scalecitations
- 2016On the measurement and interpretation of residual stress at the micro-scalecitations
- 2016Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlationcitations
- 2016A critical comparison between XRD and FIB residual stressmeasurement techniques in thin filmscitations
- 2014Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scalecitations
- 2014A critical comparison between XRD and FIB residual stress measurement techniques in thin filmscitations
- 2013X-ray diffraction study of microstructural changes during fatigue damage initiation in pipe steels: Role of the initial dislocation structurecitations
- 2012X-ray diffraction study of microstructural changes during fatigue damage initiation in steel pipescitations
- 2012Influence of mechanical properties of tungsten carbide‐cobalt thermal spray coatings on their solid particle erosion behaviourcitations
- 2012High resolution residual stress measurement on amorphous and crystalline plasma-sprayed single-splatscitations
- 2010Austenite modification of AISI 316L SS by pulsed nitrogen ion beams generated in dense plasma focus dischargescitations
- 2010Depth-sensing indentation modeling for determination of Elastic modulus of thin filmscitations
- 2010Characterization of expanded austenite developed on AISI 316L stainless steel by plasma carburizationcitations
- 2009Preparation and mechanical characterization of dense and porous zirconia produced by gel casting with gelatin as a gelling agentcitations
- 2006Titanium carbide films obtained by conversion of sputtered titanium on high carbon steelcitations
- 2006Measurement of residual stress in thermal spray coatings by the incremental hole drilling methodcitations
- 2001Influence of Si, Ni and Co additions on gold alloy for investment cast process
Places of action
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article
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
Abstract
Residual stresses play a crucial role in determining material properties and behaviour, in terms of structural integrity under monotonic and cyclic loading, and for functional performance, in terms of capacitance, conductivity, band gap, and other characteristics. The methods for experimental residual stress analysis at the macro- and micro-scales are well established, but residual stress evaluation at the nanoscale faces major challenges, e.g. the need for sample sectioning to prepare thin lamellae, by its very nature introducing major modifications to the quantity being evaluated.<br/><br/>Residual stress analysis by micro-ring core Focused Ion Beam milling directly at sample surface offers lateral resolution better than 1 μm, and encodes information about residual stress depth variation. We report a new method for residual stress depth profiling at the resolution better than 50 nm by the application of a mathematically straightforward and robust approach based on the concept of eigenstrain. The results are validated by direct comparison with measurements by nano-focus synchrotron X-ray diffraction.