| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Bastos Da Silva Fanta, Alice
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (23/23 displayed)
- 2023Thermal stability of hierarchical microstructural features in additively manufactured stainless steelcitations
- 2023Study in Phase-Transformation Temperature in Nitinol by In Situ TEM Heating
- 2023The effect of cyclic heat treatment on microstructure evolution during Plasma Arc Additive Manufacturing employing an SEM in-situ heating study
- 2023Probing the Effects of Cyclic Heating in Metal Additive Manufacturing by means of a Quasi in situ EBSD Study
- 2023Study of Phase-transformation Behavior in Additive Manufacturing of Nitinol Shape Memory Alloys by In Situ TEM Heating
- 2022Probing the role of grain boundaries in single Cu nanoparticle oxidation by in situ plasmonic scatteringcitations
- 2022Probing the role of grain boundaries in single Cu nanoparticle oxidation by in situ plasmonic scatteringcitations
- 2022Probing the role of grain boundaries in single Cu nanoparticle oxidation by in situ plasmonic scatteringcitations
- 2022High resolution crystal orientation mapping of ultrathin films in SEM and TEMcitations
- 2021Recent developments for the characterization of crystals and defects at the nanoscale using on-axis TKD in SEM
- 2021Challenges and perspectives of Transmission Kikuchi Diffraction for nanocrystalline materials characterization
- 2020Aminopropylsilatrane Linkers for Easy and Fast Fabrication of High-Quality 10 nm Thick Gold Films on SiO2 Substratescitations
- 2020Aminopropylsilatrane Linkers for Easy and Fast Fabrication of High-Quality 10 nm Thick Gold Films on SiO 2 Substratescitations
- 2019Metal-polymer hybrid nanomaterials for plasmonic ultrafast hydrogen detectioncitations
- 2018Optimal microstructural design for high thermal stability of pure FCC metals based on studying effect of twin boundaries character and network of grain boundariescitations
- 2017Influence of Ti and Cr Adhesion Layers on Ultrathin Au Filmscitations
- 2017Iron Oxide Films Prepared by Rapid Thermal Processing for Solar Energy Conversioncitations
- 2017Time-of-Flight Three Dimensional Neutron Diffraction in Transmission Mode for Mapping Crystal Grain Structurescitations
- 2017Time-of-Flight Three Dimensional Neutron Diffraction in Transmission Mode for Mapping Crystal Grain Structurescitations
- 2013Partial transformation of austenite in Al-Mn-Si TRIP steel upon tensile straining: an in situ EBSD studycitations
- 20093-D Analysis of Graphite Nodules in Ductile Cast Iron Using FIB-SEM
- 2008Three-dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co-Ni filmscitations
- 2007Orientation microscopy on nanostructured electrodeposited NiCo-Films
Places of action
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article
High resolution crystal orientation mapping of ultrathin films in SEM and TEM
Abstract
Ultrathin metallic films are important functional materials for optical and microelectronic devices. Dedicated characterization with high spatial resolution and sufficient field of view is key to the understanding of the relation between microstructure and optical and electrical properties of such thin films. Here, we have applied on-axis transmission Kikuchi diffraction (TKD) and scanning precession electron diffraction (SPED) to study the microstructure of 10 nm thick polycrystalline gold films. The study compares the results obtained from the same specimen region by the two techniques and provides insights on the limits of each diffraction technique. We compare the physical spatial resolution of on-axis TKD and SPED and discuss challenges due to the larger probe size in scanning electron microscopy (SEM). Moreover, we present an improvement for the physical spatial resolution (PSR) of on-axis TKD through acquisition in immersion mode. We show how this method extends the capabilities of SEM-based microstructure characterization of ultrathin films and achieve PSR comparable to semi-automated SPED.