Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2006Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT38citations

Places of action

Chart of shared publication
Acker, J. Van
1 / 1 shared
Masschaele, B.
1 / 2 shared
Cnudde, Veerle
1 / 39 shared
Vetter, L. De
1 / 1 shared
Chart of publication period
2006

Co-Authors (by relevance)

  • Acker, J. Van
  • Masschaele, B.
  • Cnudde, Veerle
  • Vetter, L. De
OrganizationsLocationPeople

article

Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT

  • Acker, J. Van
  • Jacobs, P. J. S.
  • Masschaele, B.
  • Cnudde, Veerle
  • Vetter, L. De
Abstract

<p>This article explores the potential of a scanning electron microscope with an energy dispersive X-ray spectrometer in combination with a new non-destructive 3D visualization technique, X-ray micro-computed tomography, as detection methods for siloxanes/silanes mixtures applied as wood preservatives. In order to have a higher contrast, bromine functional silane was added to the mixture. Scots pine and beech samples were dipped or impregnated with the mixture and subsequently scanned. Both silicon and bromine were easily detectable with both techniques. Dipped siloxanes/silanes covered the cell walls partly in beech and the lumen partly or completely in Scots pine. Impregnated siloxanes/silanes could be found in the cell walls of both wood species. From the results, it can be concluded that, under the circumstances as described in the article, impregnation with a siloxane is necessary to have cell wall penetration. The combination of scanning electron microscopy, energy dispersive X-ray spectroscopy and micro-computed tomography can offer important information concerning the localization of certain products inside wood. While the last of these can monitor changes in 3D, the other two techniques can provide detailed 2D information. Both techniques are complementary and provide important extra information.</p>

Topics
  • impedance spectroscopy
  • compound
  • scanning electron microscopy
  • tomography
  • Silicon
  • Energy-dispersive X-ray spectroscopy
  • wood