People | Locations | Statistics |
---|---|---|
Naji, M. |
| |
Motta, Antonella |
| |
Aletan, Dirar |
| |
Mohamed, Tarek |
| |
Ertürk, Emre |
| |
Taccardi, Nicola |
| |
Kononenko, Denys |
| |
Petrov, R. H. | Madrid |
|
Alshaaer, Mazen | Brussels |
|
Bih, L. |
| |
Casati, R. |
| |
Muller, Hermance |
| |
Kočí, Jan | Prague |
|
Šuljagić, Marija |
| |
Kalteremidou, Kalliopi-Artemi | Brussels |
|
Azam, Siraj |
| |
Ospanova, Alyiya |
| |
Blanpain, Bart |
| |
Ali, M. A. |
| |
Popa, V. |
| |
Rančić, M. |
| |
Ollier, Nadège |
| |
Azevedo, Nuno Monteiro |
| |
Landes, Michael |
| |
Rignanese, Gian-Marco |
|
Martin, Céline
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2022Optical Properties of Tungsten: A Parametric Study to Characterize the Role of Roughness, Surface Composition and Temperaturecitations
- 2022Optical Properties of Tungsten: A Parametric Study to Characterize the Role of Roughness, Surface Composition and Temperaturecitations
- 2018Single-crystal and polycrystalline diamond erosion studies in Pilot-PSIcitations
- 2017Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopycitations
- 2017Tungsten oxide thin film bombarded with a low energy He ion beam: evidence for a reduced erosion and W enrichmentcitations
- 2017Tungsten oxide thin film exposed to low energy He plasma: Evidence for a thermal enhancement of the erosion yieldcitations
- 2016Study of the pores inside tungsten coating after thermal cycling for fusion devicecitations
- 2015In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopiescitations
- 2015Multi-technique coupling for analysis of deuterium retention in carbon fiber composite NB31citations
- 2014Multiwavelength Raman spectroscopy analysis of a large sampling of disordered carbons extracted from the Tore Supra tokamakcitations
- 2014Thermal stability and long term hydrogen/deuterium release from soft to hard amorphous carbon layers analyzed using in-situ Raman spectroscopy. Comparison with Tore Supra depositscitations
- 2014Raman microscopy as a defect microprobe for hydrogen bonding characterization in materials used in fusion applicationscitations
- 2013Raman spectroscopy investigation of the H content of heated hard amorphous carbon layerscitations
- 2013Long Term H-Release from Amorphous Carbon Evidenced by in Situ Raman Microscopy under Isothermal Heatingcitations
- 2013Simultaneous deuterium implantation and ion beam microanalyses in CFC NB31: Understanding the in-bulk migrationcitations
- 2012Raman micro-spectroscopy as a tool to measure the absorption coefficient and the erosion rate of hydrogenated amorphous carbon films heat-treated under hydrogen bombardmentcitations
- 2011Raman study of CFC tiles extracted from the toroidal pump limiter of Tore Supracitations
- 2010Structure of the carbon layers deposited on the toroidal pump limiter of Tore Supracitations
Places of action
Organizations | Location | People |
---|
article
Tungsten oxide thin film exposed to low energy He plasma: Evidence for a thermal enhancement of the erosion yield
Abstract
Nanocrystalline tungsten oxide thin films (about 75 nm in thickness) produced by thermal oxidation of tungsten substrates were exposed to low energy He plasma (≈ 20 eV/He) with a flux of 2.5×10 18 m-2 s-1 at two temperatures: room temperature and 673 K. The structure and morphology modifications which occur after this He bombardment and annealing treatments was studied using Raman spectroscopy and transmission electron microscopy. Due to the low fluence (4×10 21 m-2) and low ion energy, we have observed only few morphology modifications after He plasma exposure at room temperature. On the contrary, at 673 K, a change in the layer color is observed associated to an important erosion. Detailed analyses before/after exposure and before/after annealing allow us to describe the He interaction with the oxide layer, its erosion and structural modification at the atomic and micrometer scale.