Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2016Dependence of short and intermediate-range order on preparation in experimental and modeled pure a-Si19citations
  • 2015Formation and structure of V-Zr amorphous alloy thin films24citations

Places of action

Chart of shared publication
Petersen, T. C.
1 / 2 shared
Haberl, B.
1 / 10 shared
Djurabekova, Flyura Gatifovna
1 / 37 shared
Holmström, E.
1 / 3 shared
Arenal, R.
1 / 16 shared
Bradby, J. E.
1 / 2 shared
Nordlund, Kai
1 / 54 shared
Pakarinen, Olli
1 / 4 shared
Williams, J. S.
1 / 39 shared
Lumpkin, Gregory R.
1 / 3 shared
Cortie, Michael B.
1 / 1 shared
King, Daniel J. M.
1 / 1 shared
Middleburgh, Simon C.
1 / 2 shared
Chart of publication period
2016
2015

Co-Authors (by relevance)

  • Petersen, T. C.
  • Haberl, B.
  • Djurabekova, Flyura Gatifovna
  • Holmström, E.
  • Arenal, R.
  • Bradby, J. E.
  • Nordlund, Kai
  • Pakarinen, Olli
  • Williams, J. S.
  • Lumpkin, Gregory R.
  • Cortie, Michael B.
  • King, Daniel J. M.
  • Middleburgh, Simon C.
OrganizationsLocationPeople

article

Dependence of short and intermediate-range order on preparation in experimental and modeled pure a-Si

  • Petersen, T. C.
  • Haberl, B.
  • Djurabekova, Flyura Gatifovna
  • Holmström, E.
  • Arenal, R.
  • Bradby, J. E.
  • Nordlund, Kai
  • Pakarinen, Olli
  • Williams, J. S.
  • Liu, A. C. Y.
Abstract

<p>Variability in the short-intermediate range order of pure amorphous Si synthesized by-different experimental and computational techniques is probed by measuring mass density, atomic coordination, bond-angle deviation, and dihedral angle deviation. It is found that there is significant variability in order parameters at these length scales in this archetypal covalently bonded, monoatomic system. This diversity strongly reflects preparation method and thermal history in both experimental and simulated systems. Where experiment and simulation do not quantitatively agree, this is partly due to inherent differences in analysis and time scales. Relaxed forms of amorphous Si quantitatively match continuous random networks generated by a hybrid method of bond switching Monte Carlo and molecular dynamics simulation. Qualitative trends were identified in other experimental and computed forms of a-Si. Ion-implanted a-Si's are less ordered than the relaxed forms. Preparation methods which narrowly avoid crystallization such as experimental pressure-induced amorphization or simulated melt-quenching result in the most disordered structures. As no unique form of amorphous Si exists, there can be no single model for the material. (C) 2016 Elsevier B.V. All rights reserved.</p>

Topics
  • density
  • impedance spectroscopy
  • amorphous
  • experiment
  • simulation
  • melt
  • molecular dynamics
  • laser emission spectroscopy
  • random
  • crystallization
  • quenching