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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Kumar, Gulshan
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Topics
Publications (4/4 displayed)
- 2020An assessment of residual stresses and micro-structure during single point incremental forming of commercially pure titanium used in biomedical applicationscitations
- 2019Observation of enhanced magnetic anisotropy in PLD YIG thin film on GGG (1 1 1) substratecitations
- 2019Experimental and Numerical Assessment of Residual Stresses in AA6061 After Surface Treatment by Deep Cold Rollingcitations
- 2017Facile Preparation of Biodegradable and Printable Polyester Filmscitations
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article
Observation of enhanced magnetic anisotropy in PLD YIG thin film on GGG (1 1 1) substrate
Abstract
<p>Magnetic properties and FMR of pulsed laser deposited Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub>(YIG) thin film on Gd<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub>(1 1 1) substrate have been investigated in the temperature range 4.2 ≤ T ≤ 300 K. The effective saturation magnetization (4πM<sub>eff</sub>), obtained from Ferromagnetic Resonance at room temperature, is found to be 2600 G, which is higher than SQUID measured 4πM<sub>S</sub>value of 1770 G. This implies that the value of 4πM<sub>eff</sub>can only be accounted by considering a negative anisotropy field (H<sub>U</sub>) of around 830 Oe at room temperature. Such an anisotropy is attributed to a compressive stress (−1.70 × 10<sup>10</sup>dyne/cm<sup>2</sup>) induced in the film closer to the film-air interface. The presence of this stress in YIG film was confirmed using multiple {hkl} stress measurements with grazing incidence X-ray diffraction performed at different depth of penetration on the YIG film.</p>