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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Kumar, Amit
Queen's University Belfast
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (23/23 displayed)
- 2023Ferrielectricity in the archetypal antiferroelectric, PbZrO3citations
- 2023Unraveling Spatiotemporal Transient Dynamics at the Nanoscale via Wavelet Transform-Based Kelvin Probe Force Microscopycitations
- 2023Ferroelectric domain wall p-n junctionscitations
- 2022Conducting ferroelectric domain walls emulating aspects of neurological behaviorcitations
- 2022Deterministic Dual control of phase competition in Strained BiFeO3 : A Multi-Parametric Structural Lithography Approach
- 2020Direct Processing of PbZr0.53Ti0.47O3 Films on Glass and Polymeric Substratescitations
- 2020Nanodomain Patterns in Ultra-Tetragonal Lead Titanate (PbTiO3)citations
- 2018Revealing the interplay of structural phase transitions and ferroelectric switching in mixed phase BiFeO3citations
- 2018Electromechanical-mnemonic effects in BiFeO3 for electric field history dependent crystallographic phase patterningcitations
- 2017Functional and structural effects of layer periodicity in chemicalsolution-deposited Pb(Zr,Ti)O3thin filmscitations
- 2017Mapping grain boundary heterogeneity at the nanoscale in a positive temperature coefficient of resistivity ceramiccitations
- 2016Local probing of ferroelectric and ferroelastic switching through stress-mediated piezoelectric spectroscopycitations
- 2015Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria filmscitations
- 2014Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiOcitations
- 2014Influence of a Single Grain Boundary on Domain Wall Motion in Ferroelectricscitations
- 2013Nanoscale mapping of oxygen vacancy kinetics in nanocrystalline Samarium doped ceria thin filmscitations
- 2013Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memoriescitations
- 2013Nanometer-scale mapping of irreversible electrochemical nucleation processes on solid Li-ion electrolytescitations
- 2013Nanoscale Probing of Voltage Activated Oxygen Reduction/Evolution Reactions in Nanopatterned (LaxSr1-x)CoO3-delta Cathodescitations
- 2013Giant energy density in [001]-textured Pb(Mg1/3Nb2/3)O-3-PbZrO3-PbTiO3 piezoelectric ceramicscitations
- 2011Measuring oxygen reduction/evolution reactions on the nanoscalecitations
- 2007Adsorption-controlled molecular-beam epitaxial growth of BiFeO3citations
- 2006Multiferroic domain dynamics in strained strontium titanatecitations
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article
Direct Processing of PbZr0.53Ti0.47O3 Films on Glass and Polymeric Substrates
Abstract
This work reports on direct crystallization of PbZr0.53Ti0.47O3 (PZT) thin films on glass and polymeric substrates, using pulsed thermal processing (PTP). Specifically, xenon flash lamps deliver pulses of high intensity, short duration, broadband light to the surface of a chemical solution deposited thin film, resulting in the crystallization of the film. Structural analysis by X-ray diffraction (XRD) and transmission electron microscopy show the existence of perovskite structure in nano-sized grains (≤5 nm). Local functional analysis by band excitation piezoelectric spectroscopy and electrostatic force microscopy confirm the presence of a ferroelectric phase and retention of voltage-written polarization for multiple days. Based on structural and functional analyses, strategies are discussed for optimization of pulse voltage and duration for the realization of crystalline ferroelectric thin films. For ∼200 nm thick PZT films on glass substrates, 500 μs-long pulses were required for crystallization, starting with 100 pulses at 350 V, 10 or 25 pulses at 400 V and in general lower number of pulses at higher voltages (resulting in higher radiant energy). Overall power densities of > 6.4 kW/cm2 were needed for appearance of peaks corresponding to the perovskite phase in the XRD. Films on glass processed at 350-400 V had a higher degree of 111-oriented perovskite grains. Higher applied radiant energy (through increased pulse voltage or count) resulted in more random and/or partially 001-oriented films. For ∼1 μm-thick PZT films on polymeric substrates, 10 to 25 250 μs-long pulses at voltages ranging between 200 to 250 V, corresponding to power densities of ∼2.8 kW/cm2, were optimal for maximized perovskite phase crystallization, while avoiding substrate damage.