Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Naji, M.
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Bassiri-Gharb, Nazanin

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (12/12 displayed)

  • 2023Ferrielectricity in the archetypal antiferroelectric, PbZrO336citations
  • 2023Ferrielectricity in the archetypal antiferroelectric, PbZrO 336citations
  • 2021Local and correlated studies of humidity-mediated ferroelectric thin film surface charge dynamics3citations
  • 2021Direct processing of PbZr0.53Ti0.47O3 films on glass and polymeric substrates9citations
  • 2020Direct Processing of PbZr0.53Ti0.47O3 Films on Glass and Polymeric Substrates9citations
  • 2020Direct processing of PbZr 0.53 Ti 0.47 O 3 films on glass and polymeric substrates9citations
  • 2018Revealing the interplay of structural phase transitions and ferroelectric switching in mixed phase BiFeO38citations
  • 2017Functional and structural effects of layer periodicity in chemicalsolution-deposited Pb(Zr,Ti)O3thin films6citations
  • 2016Local probing of ferroelectric and ferroelastic switching through stress-mediated piezoelectric spectroscopy19citations
  • 2012Growth of (111) oriented NiFe2O4 polycrystalline thin films on Pt(111) via sol-gel processing23citations
  • 2011Direct fabrication of arbitrary-shaped ferroelectric nanostructures on plastic, glass, and silicon substrates37citations
  • 2003NiO-SiO2 sol-gel nanocomposite films for optical gas sensor49citations

Places of action

Chart of shared publication
Kumar, Amit
5 / 23 shared
Tian, Mengkun
2 / 6 shared
Naden, Aaron
3 / 3 shared
Lisenkov, Sergey
2 / 2 shared
Kacher, Josh
2 / 2 shared
Yao, Yulian
5 / 5 shared
Beller, Zachary
2 / 2 shared
Ponomareva, Inna
2 / 2 shared
Kumar, Amit
3 / 39 shared
Paruch, Patrycja
1 / 7 shared
Verdaguer, Albert
1 / 3 shared
Stucki, Nicolas
1 / 3 shared
Gaponenko, Iaroslav
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Musy, Loïc
1 / 1 shared
Naden, Aaron B.
4 / 11 shared
Rodriguez, Brian J.
5 / 18 shared
Edwards, David
5 / 11 shared
Zhang, Fengyuan
3 / 4 shared
Joshi, Pooran
3 / 3 shared
Guy, Joseph G. M.
1 / 6 shared
Neumayer, Sabine M.
2 / 4 shared
Deng, Carmen Z.
1 / 1 shared
Williams, Samuel C.
1 / 1 shared
Brewer, Steven J.
1 / 1 shared
Brewer, Steven
1 / 1 shared
Jesse, Stephen
1 / 14 shared
Chen, Long-Qing
1 / 6 shared
Cao, Ye
1 / 5 shared
Kalinin, Sergei V.
1 / 18 shared
Kim, Suenne
1 / 2 shared
Bastani, Yaser
1 / 1 shared
King, William P.
1 / 4 shared
Lu, Haidong
1 / 4 shared
Sandhage, Kenneth H.
1 / 3 shared
Marder, Seth
1 / 5 shared
Gruverman, Alexei
1 / 12 shared
Chart of publication period
2023
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2020
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2017
2016
2012
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Co-Authors (by relevance)

  • Kumar, Amit
  • Tian, Mengkun
  • Naden, Aaron
  • Lisenkov, Sergey
  • Kacher, Josh
  • Yao, Yulian
  • Beller, Zachary
  • Ponomareva, Inna
  • Kumar, Amit
  • Paruch, Patrycja
  • Verdaguer, Albert
  • Stucki, Nicolas
  • Gaponenko, Iaroslav
  • Musy, Loïc
  • Naden, Aaron B.
  • Rodriguez, Brian J.
  • Edwards, David
  • Zhang, Fengyuan
  • Joshi, Pooran
  • Guy, Joseph G. M.
  • Neumayer, Sabine M.
  • Deng, Carmen Z.
  • Williams, Samuel C.
  • Brewer, Steven J.
  • Brewer, Steven
  • Jesse, Stephen
  • Chen, Long-Qing
  • Cao, Ye
  • Kalinin, Sergei V.
  • Kim, Suenne
  • Bastani, Yaser
  • King, William P.
  • Lu, Haidong
  • Sandhage, Kenneth H.
  • Marder, Seth
  • Gruverman, Alexei
OrganizationsLocationPeople

article

Direct Processing of PbZr0.53Ti0.47O3 Films on Glass and Polymeric Substrates

  • Bassiri-Gharb, Nazanin
  • Kumar, Amit
  • Rodriguez, Brian J.
  • Edwards, David
  • Naden, Aaron
  • Zhang, Fengyuan
  • Joshi, Pooran
  • Yao, Yulian
Abstract

This work reports on direct crystallization of PbZr0.53Ti0.47O3 (PZT) thin films on glass and polymeric substrates, using pulsed thermal processing (PTP). Specifically, xenon flash lamps deliver pulses of high intensity, short duration, broadband light to the surface of a chemical solution deposited thin film, resulting in the crystallization of the film. Structural analysis by X-ray diffraction (XRD) and transmission electron microscopy show the existence of perovskite structure in nano-sized grains (≤5 nm). Local functional analysis by band excitation piezoelectric spectroscopy and electrostatic force microscopy confirm the presence of a ferroelectric phase and retention of voltage-written polarization for multiple days. Based on structural and functional analyses, strategies are discussed for optimization of pulse voltage and duration for the realization of crystalline ferroelectric thin films. For ∼200 nm thick PZT films on glass substrates, 500 μs-long pulses were required for crystallization, starting with 100 pulses at 350 V, 10 or 25 pulses at 400 V and in general lower number of pulses at higher voltages (resulting in higher radiant energy). Overall power densities of > 6.4 kW/cm2 were needed for appearance of peaks corresponding to the perovskite phase in the XRD. Films on glass processed at 350-400 V had a higher degree of 111-oriented perovskite grains. Higher applied radiant energy (through increased pulse voltage or count) resulted in more random and/or partially 001-oriented films. For ∼1 μm-thick PZT films on polymeric substrates, 10 to 25 250 μs-long pulses at voltages ranging between 200 to 250 V, corresponding to power densities of ∼2.8 kW/cm2, were optimal for maximized perovskite phase crystallization, while avoiding substrate damage.

Topics
  • perovskite
  • surface
  • grain
  • phase
  • x-ray diffraction
  • thin film
  • glass
  • glass
  • transmission electron microscopy
  • random
  • crystallization
  • spectroscopy
  • Electrostatic force microscopy