Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Van Den Beld, Wesley Theodorus Eduardus

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University of Twente

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2024Oxidation of thin film binary entropy alloyscitations
  • 2022Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes5citations
  • 2022Fracture Toughness of Free-Standing ZrSiₓ Thin Films Measured Using Crack-on-a-Chip Method1citations
  • 2021Strengthening ultrathin Si3N4 membranes by compressive surface stress12citations
  • 2021Hydrogen etch resistance of aluminium oxide passivated graphitic layers2citations
  • 2019Atomic H diffusion and C etching in multilayer graphene monitored using a y based optical sensor2citations

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Ackermann, Marcelo
1 / 1 shared
Van De Kruijs, Robbert
5 / 22 shared
Homsma, Martijn
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Ahmadi, M.
1 / 11 shared
Shafikov, Airat
3 / 3 shared
Schurink, B.
1 / 2 shared
Kooi, B. J.
1 / 26 shared
Houweling, Silvester
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Graaf, S. De
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Benschop, J. P. H.
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Bijkerk, F.
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Benschop, Jos P. H.
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Schurink, Bart
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Bijkerk, Fred
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Verbakel, Jort D.
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Kizir, Seda
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Pushkarev, Roman
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Sturm, Jacobus
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Lee, Chris J.
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Mund, Baibhav
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Soroka, Olena
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2022
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Co-Authors (by relevance)

  • Ackermann, Marcelo
  • Van De Kruijs, Robbert
  • Homsma, Martijn
  • Ahmadi, M.
  • Shafikov, Airat
  • Schurink, B.
  • Kooi, B. J.
  • Houweling, Silvester
  • Graaf, S. De
  • Benschop, J. P. H.
  • Bijkerk, F.
  • Benschop, Jos P. H.
  • Schurink, Bart
  • Bijkerk, Fred
  • Verbakel, Jort D.
  • Kizir, Seda
  • Pushkarev, Roman
  • Sturm, Jacobus
  • Lee, Chris J.
  • Mund, Baibhav
  • Soroka, Olena
OrganizationsLocationPeople

article

Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes

  • Van Den Beld, Wesley Theodorus Eduardus
  • Ahmadi, M.
  • Shafikov, Airat
  • Schurink, B.
  • Kooi, B. J.
  • Van De Kruijs, Robbert
  • Houweling, Silvester
  • Graaf, S. De
  • Benschop, J. P. H.
  • Bijkerk, F.
Abstract

<p>In this work, we investigated the influence of composition on the polycrystalline structure, elastic properties and fracture strength, of Zr<sub>x</sub>Si<sub>1-x</sub>, Nb<sub>x</sub>Si<sub>1-x,</sub> and Mo<sub>x</sub>Si<sub>1-x</sub> free-standing thin films that were deposited by magnetron sputtering and subsequently annealed at 500 °C. Despite deviations from the stoichiometric composition, the crystalline structure of all films, except for the most Zr-rich Zr<sub>x</sub>Si<sub>1-x</sub>, corresponded to their respective stoichiometric disilicide structures, without the formation of a second-phase. Off-stoichiometry was found to be accompanied by the presence of lattice defects and a decrease of the grain size, which bring about a lower tensile stress in the films. The dependence of the fracture strength on the composition was remarkably similar for the three silicides, with the lowest and highest strength values occurring for samples with 30% and 37–40% of metal content, respectively. The observed dependence of strength on composition was attributed to the combination of the Hall-Petch effect, changes in the morphology and strength of grain boundaries, and the enhancement of crystal plasticity due to lattice defects induced by off-stoichiometry.</p>

Topics
  • grain
  • grain size
  • phase
  • thin film
  • strength
  • defect
  • plasticity
  • crystal plasticity
  • silicide