Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2020Elucidating the capability of electron backscattering for 3D nano-structure determination2citations
  • 2020The effect of ion implantation on reflection electron energy loss spectroscopy2citations
  • 2019Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling1citations

Places of action

Chart of shared publication
Vos, Maarten
3 / 18 shared
Reboh, S.
1 / 6 shared
Grande, P. L.
3 / 6 shared
Selau, F. F.
2 / 2 shared
Tee, B. P. E.
1 / 1 shared
Marmitt, G. G.
2 / 2 shared
Andrade, A. M. H. De
1 / 1 shared
Sulzbach, M. C.
1 / 1 shared
Pereira, L. G.
1 / 1 shared
Chart of publication period
2020
2019

Co-Authors (by relevance)

  • Vos, Maarten
  • Reboh, S.
  • Grande, P. L.
  • Selau, F. F.
  • Tee, B. P. E.
  • Marmitt, G. G.
  • Andrade, A. M. H. De
  • Sulzbach, M. C.
  • Pereira, L. G.
OrganizationsLocationPeople

article

The effect of ion implantation on reflection electron energy loss spectroscopy

  • Selau, F. F.
  • Tee, B. P. E.
  • Vos, Maarten
  • Marmitt, G. G.
  • Trombini, H.
  • Grande, P. L.
  • Andrade, A. M. H. De
Abstract

<p>Gold-implanted aluminum films are used to investigate how reflection electron energy loss spectra (REELS) change due to the presence of a small concentration of heavy atoms at a specific depth. Au ions were implanted with 30, 100 and 300 keV energy. REELS spectra were taken at energies between 10 and 40 keV. Large changes in the REELS spectra are observed after Au implantation, but the nature of the change indicates that they are not due to modification of the dielectric function of the implanted layer, but should be interpreted as changes in the partial intensities that make up the spectrum. Two models are used to describe the results quantitatively. One method assumes v-shaped trajectories (i.e. only a single elastic deflection) and the REELS spectrum can then be calculated in a closed form. The other method is a Monte-Carlo based simulation which allows for multiple elastic deflections. Both methods describe the experimental spectra quite well, but at larger energy losses significant deviations occur between the measured and calculated intensity for both the implanted and not-implanted films. The difference in the REELS spectrum before and after implantation is less affected by these discrepancies, and can be used to obtain an estimate of both the depth and concentration of the implanted Au atoms. Due to the presence of sharp plasmon features in the energy loss spectrum of aluminum the experiment can tell us directly which partial intensities are affected by the Au impurities, as the recoil energies due to elastic scattering make it possible to identify the contribution of Au to the first few plasmons. As the Au implantation fluence is known the measurement can be used to determine the ratio of the Au and Al elastic scattering cross sections, which deviates strongly from that calculated from the Rutherford formula.</p>

Topics
  • impedance spectroscopy
  • experiment
  • simulation
  • aluminium
  • laser emission spectroscopy
  • gold
  • electron energy loss spectroscopy