| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Vos, Maarten
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2020Elucidating the capability of electron backscattering for 3D nano-structure determinationcitations
- 2020The effect of ion implantation on reflection electron energy loss spectroscopycitations
- 2019Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profilingcitations
- 2018Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantationcitations
- 2018Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantationcitations
- 2018The influence of shallow core levels on the shape of REELS spectracitations
- 2016A model dielectric function for low and very high momentum transfercitations
- 2016Measurement of the band gap by reflection electron energy loss spectroscopycitations
- 2015Energy Loss Function of Solids Assessed by Ion Beam Energy-Loss Measurements: Practical Application to Ta2O5citations
- 2015Energy Loss Function of Solids Assessed by Ion Beam Energy-Loss Measurementscitations
- 2015Neutralization and wake effects on the Coulomb explosion of swift H2+ ions traversing thin filmscitations
- 2014Direct observation of the major components of mouse bones and related compounds by electron Rutherford backscattering spectroscopy
- 2014The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx filmscitations
- 2010Experimental observation of the strong influence of crystal orientation on Electron Rutherford Backscattering Spectracitations
- 2007Electron inelastic mean free path in solids as determined by electron Rutherford back-scatteringcitations
- 2007Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscatteringcitations
- 2005Spectral momentum densities of vanadium and vanadium oxide as measured by high energy (e, 2e) spectroscopycitations
- 2005Electron and neutron scattering from polymer films at high momentum transfercitations
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article
The influence of shallow core levels on the shape of REELS spectra
Abstract
<p>It is well established that the shape of spectra acquired using reflection electron energy loss spectroscopy (REELS) is determined by the dielectric function. Extracting the dielectric function from REELS spectra is a real challenge as it is governed by strong multiple scattering. It is generally assumed that the contribution of shallow core levels (with binding energies over 100 eV) to the REELS data can be neglected when one interprets valence band REELS data that usually extends to, at most, 100 eV energy loss. Here we show that, especially when incoming energies over 1 keV are used, this is not the case and that the intensity of the REELS spectrum can only be calculated correctly if the shallow core levels are taken into account. The implications for this for the extraction of the dielectric function from REELS data is discussed.</p>