| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Tougaard, Sven Mosbæk
University of Southern Denmark
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2022QUEELScitations
- 2020Optical properties of molybdenum in the ultraviolet and extreme ultraviolet by reflection electron energy loss spectroscopycitations
- 2020Universal inelastic electron scattering cross-section including extrinsic and intrinsic excitations in XPScitations
- 2017Optical properties and electronic transitions of zinc oxide, ferric oxide, cerium oxide, and samarium oxide in the ultraviolet and extreme ultravioletcitations
- 2016Determination of electronic properties of nanostructures using reflection electron energy loss spectroscopycitations
- 2016Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray rangecitations
- 2016Composition dependence of dielectric and optical properties of Hf-Zr-silicate thin films grown on Si(100) by atomic layer depositioncitations
- 2016Band-Gap Widening at the Cu(In,Ga)(S,Se)2 Surface:A Novel Determination Approach Using Reflection Electron Energy Loss Spectroscopycitations
- 2016Band-Gap Widening at the Cu(In,Ga)(S,Se)2 Surfacecitations
- 2016Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin filmscitations
- 2015Effects of cation compositions on the electronic properties and optical dispersion of indium zinc tin oxide thin films by electron spectroscopycitations
- 2014Electronic and optical properties of Fe, Pd, and Ti studied by reflection electron energy loss spectroscopycitations
- 2013Factor analysis and advanced inelastic background analysis in XPScitations
- 2013Surface excitation parameter for allotropic forms of carboncitations
- 2013Effects of gas environment on electronic and optical properties of amorphous indium zinc tin oxide thin filmscitations
- 2011Dielectric response functions of the (0001̄), (101̄3) GaN single crystalline and disordered surfaces studied by reflection electron energy loss spectroscopycitations
- 2009Dielectric and optical properties of Zr silicate thin films grown on Si(100) by atomic layer depositioncitations
- 2008Test of validity of the V-type approach for electron trajectories in reflection electron energy loss spectroscopycitations
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article
Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films
Abstract
Electronic and optical properties of Fe-Ni alloy thin films grown on Si (1 0 0) by ion beam sputter deposition were studied via quantitative analyses of reflection electron energy loss spectra (REELS). The analysis was carried out by using the QUASES-XS-REELS and QUEELS-ε(k,ω)-REELS softwares to determine the energy loss function (ELF) and the dielectric functions and optical properties by analyzing the experimental spectra. For Ni, the ELF shows peaks around 3.6, 7.5, 11.7, 20.5, 27.5, 67 and 78 eV. The peak positions of the ELF for Fe 28 Ni 72 are similar to those of Fe 51 Ni 49 , even though there is a small peak shift from 18.5 eV for Fe 51 Ni 49 to 18.7 eV for Fe 28 Ni 72 . A plot of n, k, ε 1 , and ε 2 shows that the QUEELS-ε(k,ω)-REELS software for analysis of REELS spectra is useful for the study of optical properties of transition metal alloys. For Fe-Ni alloy with high Ni concentration (Fe 28 Ni 72 ), ε 1 , and ε 2 have strong similarities with those of Fe. This indicates that the presence of Fe in the Fe-Ni alloy thin films has a strong effect.