Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Tahir, Dahlang

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2023Effect of Sintering Temperature on the Microstructure Behavior of Gelcasted Porous Ceramics Using Cassava Starch as Pore Template3citations
  • 2023Nickel Slag/Laterite Soil and Nickel Slag/Iron Sand Nanocomposites: Structural, Optical, and Electromagnetic Absorption Properties10citations
  • 2016Composition dependence of dielectric and optical properties of Hf-Zr-silicate thin films grown on Si(100) by atomic layer deposition32citations
  • 2016Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films28citations

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Chart of shared publication
Heryanto, Heryanto
2 / 4 shared
Rahman, Abd
1 / 1 shared
Ilyas, Nita Magfirah
1 / 1 shared
Tjahjanto, Rachmat Triandi
1 / 2 shared
Pratiwi, Diana Eka
1 / 1 shared
Putri, Suriati Eka
1 / 1 shared
Bradley, David A.
1 / 1 shared
Rahmat, Roni
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Siswanto, Siswanto
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Sulieman, Abdelmoneim
1 / 2 shared
Tougaard, Sven Mosbæk
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Oh, Suhk Kun
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Kang, Hee Jae
2 / 2 shared
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2023
2016

Co-Authors (by relevance)

  • Heryanto, Heryanto
  • Rahman, Abd
  • Ilyas, Nita Magfirah
  • Tjahjanto, Rachmat Triandi
  • Pratiwi, Diana Eka
  • Putri, Suriati Eka
  • Bradley, David A.
  • Rahmat, Roni
  • Siswanto, Siswanto
  • Sulieman, Abdelmoneim
  • Tougaard, Sven Mosbæk
  • Oh, Suhk Kun
  • Kang, Hee Jae
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article

Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films

  • Tougaard, Sven Mosbæk
  • Tahir, Dahlang
  • Oh, Suhk Kun
  • Kang, Hee Jae
Abstract

Electronic and optical properties of Fe-Ni alloy thin films grown on Si (1 0 0) by ion beam sputter deposition were studied via quantitative analyses of reflection electron energy loss spectra (REELS). The analysis was carried out by using the QUASES-XS-REELS and QUEELS-ε(k,ω)-REELS softwares to determine the energy loss function (ELF) and the dielectric functions and optical properties by analyzing the experimental spectra. For Ni, the ELF shows peaks around 3.6, 7.5, 11.7, 20.5, 27.5, 67 and 78 eV. The peak positions of the ELF for Fe 28 Ni 72 are similar to those of Fe 51 Ni 49 , even though there is a small peak shift from 18.5 eV for Fe 51 Ni 49 to 18.7 eV for Fe 28 Ni 72 . A plot of n, k, ε 1 , and ε 2 shows that the QUEELS-ε(k,ω)-REELS software for analysis of REELS spectra is useful for the study of optical properties of transition metal alloys. For Fe-Ni alloy with high Ni concentration (Fe 28 Ni 72 ), ε 1 , and ε 2 have strong similarities with those of Fe. This indicates that the presence of Fe in the Fe-Ni alloy thin films has a strong effect.

Topics
  • Deposition
  • impedance spectroscopy
  • thin film
  • quantitative determination method