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| Naji, M. |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Azam, Siraj |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Samarin, Sergey
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Topics
Publications (9/9 displayed)
- 2024Electrochemical characterization and structural analysis of (In2O3)/(Fe2O3) nanocomposites for high-performance supercapacitorscitations
- 2021Polymer-wrapped reduced graphene oxide/nickel cobalt ferrite nanocomposites as tertiary hybrid supercapacitorscitations
- 2020Porosity evaluation and positron annihilation study of mesoporous aluminum oxy-hydroxide ceramicscitations
- 2020Heterojunction formation in In2O3–NiO nanocompositescitations
- 2016Elastic versus inelastic spin-polarized electron scattering from a ferromagnetic surfacecitations
- 2013Influence of polar groups in binary polymer blends on positronium formationcitations
- 2007Magnetic anisotropy and electronic structure of iron films on W(1 1 0) by spin-polarized two-electron spectroscopy
- 2007Spin-dependent reflection of very-low-energy electrons from W(110)citations
- 2007Application of two-electron spectroscopy in reflection for studying electronic structure of surfaces and thin filmscitations
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article
Application of two-electron spectroscopy in reflection for studying electronic structure of surfaces and thin films
Abstract
Since first observations of the (e,2e) reaction in reflection geometry on solid surfaces this phenomenon was thoroughly investigated in order to understand the mechanism of two correlated electrons emission. At the same time this technique has been developing to become a spectroscopic tool for studying solid surfaces. In this contribution we present two examples of how valuable information on electronic structure of solid surface can be extracted from the (e,2e) spectra. The first concerns a dielectric LiF film and the second a ferromagnetic ultra-thin Co film. The combination of (e,2e) and electron energy loss spectroscopy allows the measurement of the energy gap E-g, valence bandwidth Delta E, electron affinity X and excitonic levels position E-ex of the dielectric. These parameters depend on the thickness, morphology and crystallinity of the film that were studied by transmission and scanning electron microscopy. In case of the Co film a spin-polarized incident electrons were used to probe spin-dependent features of the cobalt valence band. (c) 2007 Elsevier B.V. All rights reserved.