Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Went, M. R.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2007Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering15citations
  • 2007Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering6citations
  • 2005Spectral momentum densities of vanadium and vanadium oxide as measured by high energy (e, 2e) spectroscopy2citations

Places of action

Chart of shared publication
Vos, Maarten
3 / 18 shared
Gale, M. N.
1 / 1 shared
Chen, C.
1 / 24 shared
Chart of publication period
2007
2005

Co-Authors (by relevance)

  • Vos, Maarten
  • Gale, M. N.
  • Chen, C.
OrganizationsLocationPeople

article

Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering

  • Vos, Maarten
  • Went, M. R.
Abstract

<p>Energetic electrons scattering elastically over large angles from atoms lose energy depending on the mass of the scattering atom. If the energy of the incident electron is large enough, 10's of keV, this energy loss can be measured with high resolution electron spectrometers, allowing the separation of heavy and light elements. This technique is in many ways analogous to Rutherford back-scattering (RBS), with electrons employed as the scattering particle rather than ions. We refer to these measurements as electron Rutherford back-scattering (ERBS). We present ERBS data for a simple two-layer system (gold on carbon). It is shown that this method can be used to determine the inelastic mean free path of electrons in carbon. We obtain a value of 350 ± 50 Å for 40 keV electrons in amorphous carbon. A comparison of the ERBS results is made with traditional RBS results from the same film. A consistent interpretation of both measurements using calculated differential elastic cross sections was not obtained.</p>

Topics
  • impedance spectroscopy
  • amorphous
  • Carbon
  • gold
  • Rutherford backscattering spectrometry