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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Vos, Maarten
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2020Elucidating the capability of electron backscattering for 3D nano-structure determinationcitations
- 2020The effect of ion implantation on reflection electron energy loss spectroscopycitations
- 2019Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profilingcitations
- 2018Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantationcitations
- 2018Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantationcitations
- 2018The influence of shallow core levels on the shape of REELS spectracitations
- 2016A model dielectric function for low and very high momentum transfercitations
- 2016Measurement of the band gap by reflection electron energy loss spectroscopycitations
- 2015Energy Loss Function of Solids Assessed by Ion Beam Energy-Loss Measurements: Practical Application to Ta2O5citations
- 2015Energy Loss Function of Solids Assessed by Ion Beam Energy-Loss Measurementscitations
- 2015Neutralization and wake effects on the Coulomb explosion of swift H2+ ions traversing thin filmscitations
- 2014Direct observation of the major components of mouse bones and related compounds by electron Rutherford backscattering spectroscopy
- 2014The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx filmscitations
- 2010Experimental observation of the strong influence of crystal orientation on Electron Rutherford Backscattering Spectracitations
- 2007Electron inelastic mean free path in solids as determined by electron Rutherford back-scatteringcitations
- 2007Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscatteringcitations
- 2005Spectral momentum densities of vanadium and vanadium oxide as measured by high energy (e, 2e) spectroscopycitations
- 2005Electron and neutron scattering from polymer films at high momentum transfercitations
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article
Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering
Abstract
<p>Energetic electrons scattering elastically over large angles from atoms lose energy depending on the mass of the scattering atom. If the energy of the incident electron is large enough, 10's of keV, this energy loss can be measured with high resolution electron spectrometers, allowing the separation of heavy and light elements. This technique is in many ways analogous to Rutherford back-scattering (RBS), with electrons employed as the scattering particle rather than ions. We refer to these measurements as electron Rutherford back-scattering (ERBS). We present ERBS data for a simple two-layer system (gold on carbon). It is shown that this method can be used to determine the inelastic mean free path of electrons in carbon. We obtain a value of 350 ± 50 Å for 40 keV electrons in amorphous carbon. A comparison of the ERBS results is made with traditional RBS results from the same film. A consistent interpretation of both measurements using calculated differential elastic cross sections was not obtained.</p>