Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2018Increasing the Efficiency of Amino Acids Detection by Electrochemical Methods on Amorphous Carbon Nitride a-CNx Electrodescitations
  • 2018Influence of the atomic nitrogen content in amorphous carbon nitride thin films on the modulation of their polarizable interfaces properties17citations
  • 2014Improved electrochemical detection of a transthyretin synthetic peptide in the nanomolar range with a two-electrode system integrated in a glass/PDMS microchip.19citations
  • 2014Improved electrochemical detection of a transthyretin synthetic peptide in the nanomolar range with a two-electrode system integrated in a glass/PDMS microchip.19citations
  • 2011Photonic crystal patterning of luminescent sol-gel films for light extraction17citations
  • 2000Thickness dependence of the stability of the charge-ordered state in Pr$_{0.5}$Ca$_{0.5}$MnO$_{3}$ thin filmscitations
  • 2000Spectacular decrease of the melting magnetic field in the charge-ordered state of tensile Pr0.5Ca0.5MnO3 filmscitations

Places of action

Chart of shared publication
Potier, Isabelle Le
2 / 2 shared
Pailleret, Alain
2 / 31 shared
Gamby, Jean
4 / 10 shared
Tribollet, Bernard
4 / 97 shared
Deslouis, Claude
4 / 37 shared
Faure, Mathilde
4 / 9 shared
Billon, Florence
2 / 9 shared
Chebil, Syrine
2 / 3 shared
Pallandre, Antoine
2 / 3 shared
Le Potier, Isabelle
1 / 1 shared
Taverna, Myriam
2 / 2 shared
Gacoin, Thierry
1 / 13 shared
Decanini, D.
1 / 1 shared
Weisbuch, C.
1 / 1 shared
Benisty, Henri
1 / 2 shared
Revaux, Amélie
1 / 3 shared
Guillemot, François
1 / 2 shared
Dantelle, Géraldine
1 / 3 shared
Boilot, Jean-Pierre
1 / 6 shared
Prellier, Wilfrid
2 / 45 shared
Simon, Ch.
2 / 12 shared
Raveau, B.
2 / 15 shared
Mercey, B.
2 / 11 shared
Hervieu, M.
1 / 11 shared
Lecoeur, Ph.
1 / 3 shared
Chart of publication period
2018
2014
2011
2000

Co-Authors (by relevance)

  • Potier, Isabelle Le
  • Pailleret, Alain
  • Gamby, Jean
  • Tribollet, Bernard
  • Deslouis, Claude
  • Faure, Mathilde
  • Billon, Florence
  • Chebil, Syrine
  • Pallandre, Antoine
  • Le Potier, Isabelle
  • Taverna, Myriam
  • Gacoin, Thierry
  • Decanini, D.
  • Weisbuch, C.
  • Benisty, Henri
  • Revaux, Amélie
  • Guillemot, François
  • Dantelle, Géraldine
  • Boilot, Jean-Pierre
  • Prellier, Wilfrid
  • Simon, Ch.
  • Raveau, B.
  • Mercey, B.
  • Hervieu, M.
  • Lecoeur, Ph.
OrganizationsLocationPeople

article

Influence of the atomic nitrogen content in amorphous carbon nitride thin films on the modulation of their polarizable interfaces properties

  • Pailleret, Alain
  • Gamby, Jean
  • Haghiri-Gosnet, Anne-Marie
  • Tribollet, Bernard
  • Deslouis, Claude
  • Faure, Mathilde
  • Billon, Florence
Abstract

International audience ; Amorphous carbon nitride (a-CNX) thin films possessing different nitrogen contents (0.12 ≤ x ≤ 0.30) have been synthetized by the DC cathodic reactive magnetron sputtering technique on transparent glass/indium tin oxide (ITO) substrates. They were characterized ex-situ by using two microscopy techniques: scanning electron microscopy (SEM) and atomic force microscopy (AFM), a spectroscopic technique: X-ray photoelectron spectroscopy (XPS), and in solution by using electrochemical methods: cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). The results obtained with these methods have permitted to highlight why a-CN0.30, the a-CNx sample with the highest nitrogen content among those investigated in this work, behaves both as a dielectrical material (low electronic conductivity) and as an ideally polarizable interface (high polarization resistance). For this purpose, the role of both the ionic strength and the overpotential were investigated in blocking electrode conditions, i.e. only in the presence of the supporting electrolyte. It was observed that the interfacial capacitance can be strongly electrically modulated with the ionic charge concentration and with the applied overpotential. The understanding of the behaviour of a-CNx materials presents a great challenge for their integration in new microfluidic transistor type devices in view of the elaboration of polarizable interface flow-field effect transistors (PI-FFETs).

Topics
  • surface
  • amorphous
  • Carbon
  • scanning electron microscopy
  • thin film
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • glass
  • reactive
  • glass
  • Nitrogen
  • nitride
  • strength
  • electrochemical-induced impedance spectroscopy
  • interfacial
  • tin
  • cyclic voltammetry
  • Indium