Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2021Design and optimization of hole collectors based on nc-SiOx:H for high-efficiency silicon heterojunction solar cells34citations
  • 2021On current collection from supporting layers in perovskite/c-Si tandem solar cells1citations
  • 2018Poly-crystalline silicon-oxide films as carrier-selective passivating contacts for c-Si solar cells47citations
  • 2017Poly-Si(O)x passivating contacts for high-efficiency c-Si IBC solar cells19citations
  • 2003Structural film characteristics related to the passivation properties of high-rate (> 0.5 nm/s) plasma deposited a-SiN x :Hcitations
  • 2003Influence of the high-temperature "firing" step on high-rate plasma deposited silicon nitride films used as bulk passivating antireflection coatings on silicon solar cellscitations
  • 2002High-rate deposition of a-SiNx:H for photovoltaic applications by the expanding thermal plasmacitations

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Chart of shared publication
Procel, Paul
4 / 14 shared
Zhao, Yifeng
1 / 7 shared
Yang, Guangtao
3 / 7 shared
Mazzarella, Luana
1 / 9 shared
Isabella, Olindo
4 / 18 shared
Han, Can
1 / 4 shared
Zeman, Miro
4 / 21 shared
Heerden, Rik Van
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Singh, Manvika
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Santbergen, Rudi
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Syifai, Indra
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Guo, Peiqing
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Zhang, Yue
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Hong, Jg
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Sanden, Mcm Richard Van De
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Soppe, Wim J.
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Rieffe, Hc
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Kessels, Wmm Erwin
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Arnoldbik, Wm Wim
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Assche, Fjh Ferdie Van
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Lauinger, T.
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Schram, Dc Daan
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Moschner, Jd
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Chart of publication period
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2018
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Co-Authors (by relevance)

  • Procel, Paul
  • Zhao, Yifeng
  • Yang, Guangtao
  • Mazzarella, Luana
  • Isabella, Olindo
  • Han, Can
  • Zeman, Miro
  • Heerden, Rik Van
  • Singh, Manvika
  • Santbergen, Rudi
  • Syifai, Indra
  • Guo, Peiqing
  • Zhang, Yue
  • Hong, Jg
  • Sanden, Mcm Richard Van De
  • Soppe, Wim J.
  • Rieffe, Hc
  • Kessels, Wmm Erwin
  • Arnoldbik, Wm Wim
  • Assche, Fjh Ferdie Van
  • Lauinger, T.
  • Schram, Dc Daan
  • Moschner, Jd
OrganizationsLocationPeople

article

Poly-Si(O)x passivating contacts for high-efficiency c-Si IBC solar cells

  • Procel, Paul
  • Yang, Guangtao
  • Weeber, Arthur
  • Zhang, Yue
  • Isabella, Olindo
  • Zeman, Miro
Abstract

<p>Highest conversion efficiency in crystalline silicon (c-Si) solar cells can be enabled by quenching minority carriers' recombination at c-Si/contact interface owing to carrier-selective passivating contacts. With the semi-insulating poly-crystalline silicon (SIPOS, poly-Si) a very good passivation of c-Si surfaces was obtained. We have explored these passivating structures on IBC solar cells and obtained over 22% efficiency with over 23% within reach on the short term. We present in detail the passivation quality of p-type and n-type ion-implanted LPCVD poly-crystalline silicon (poly-Si) and its relation to the doping profile. Optimized poly-Si layers in the role of emitter and BSF showed excellent passivation (J<sub>0,emitter</sub> = 11.5 fA/cm<sup>2</sup> and J<sub>0,BSF</sub> = 4.5 fA/cm<sup>2</sup>) and have been deployed in FSF-based IBC c-Si solar cells using a simple self-aligned patterning process. Applying an optimized passivation of FSF by PECVD a-Si:H/SiNx layer (J<sub>0,FSF</sub> = 6.5 fA/cm<sup>2</sup>) leads to a cell with efficiency of 22.1% (V<sub>OC</sub> = 709 mV, J<sub>SC</sub> = 40.7 mA/cm<sup>2</sup>, FF = 76.6%). Since over 83% FF has been reached with adjusted metallization technology on similar IBC structures, we believe 23% efficiency is within reach on the short term. Further improvement, especially at J<sub>SC</sub> level, is expected by deploying less absorbing carrier-selective passivating contacts based on poly-Si or wide bandgap poly-SiO<sub>x</sub> layers (J<sub>0</sub> ~ 10 fA/cm<sup>2</sup>).</p>

Topics
  • impedance spectroscopy
  • surface
  • laser emission spectroscopy
  • Silicon
  • quenching
  • aligned