| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
Martin, Céline
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2022Optical Properties of Tungsten: A Parametric Study to Characterize the Role of Roughness, Surface Composition and Temperaturecitations
- 2022Optical Properties of Tungsten: A Parametric Study to Characterize the Role of Roughness, Surface Composition and Temperaturecitations
- 2018Single-crystal and polycrystalline diamond erosion studies in Pilot-PSIcitations
- 2017Advanced spectroscopic analyses on a:C-H materials: Revisiting the EELS characterization and its coupling with multi-wavelength Raman spectroscopycitations
- 2017Tungsten oxide thin film bombarded with a low energy He ion beam: evidence for a reduced erosion and W enrichmentcitations
- 2017Tungsten oxide thin film exposed to low energy He plasma: Evidence for a thermal enhancement of the erosion yieldcitations
- 2016Study of the pores inside tungsten coating after thermal cycling for fusion devicecitations
- 2015In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopiescitations
- 2015Multi-technique coupling for analysis of deuterium retention in carbon fiber composite NB31citations
- 2014Multiwavelength Raman spectroscopy analysis of a large sampling of disordered carbons extracted from the Tore Supra tokamakcitations
- 2014Thermal stability and long term hydrogen/deuterium release from soft to hard amorphous carbon layers analyzed using in-situ Raman spectroscopy. Comparison with Tore Supra depositscitations
- 2014Raman microscopy as a defect microprobe for hydrogen bonding characterization in materials used in fusion applicationscitations
- 2013Raman spectroscopy investigation of the H content of heated hard amorphous carbon layerscitations
- 2013Long Term H-Release from Amorphous Carbon Evidenced by in Situ Raman Microscopy under Isothermal Heatingcitations
- 2013Simultaneous deuterium implantation and ion beam microanalyses in CFC NB31: Understanding the in-bulk migrationcitations
- 2012Raman micro-spectroscopy as a tool to measure the absorption coefficient and the erosion rate of hydrogenated amorphous carbon films heat-treated under hydrogen bombardmentcitations
- 2011Raman study of CFC tiles extracted from the toroidal pump limiter of Tore Supracitations
- 2010Structure of the carbon layers deposited on the toroidal pump limiter of Tore Supracitations
Places of action
| Organizations | Location | People |
|---|
article
Long Term H-Release from Amorphous Carbon Evidenced by in Situ Raman Microscopy under Isothermal Heating
Abstract
We study the kinetics of the H release from plasma-deposited hydrogenated amorphous carbon films under isothermal heating at 450, 500 and 600 °C for long times up to several days using in situ Raman microscopy. Four Raman parameters are analyzed. They allow the identification of different processes such as the carbon network reorganization and the H release from sp3 or sp2 carbon atoms and the corresponding timescales. Carbon reorganization with aromatization and loss of sp3 hybridization occurs first in 100 minutes at 500 °C. The final organization is similar at all investigated temperatures. Full H release from sp3 carbon occurs on a longer timescale of about 10 hours while H release from sp2 carbon atoms is only partial, even after several days. All these processes occur more rapidly with higher initial H content, in agreement with what is known about the stability of these types of films. A quantitative analysis of these kinetics studies gives valuable information about the microscopic processes at the origin of the H release through the determination of activation energies.