Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2016Low thermal budget, photonic-cured compact TiO<sub>2</sub> layers for high-efficiency perovskite solar cells54citations
  • 2009Polyamide 66 as a cryogenic dielectric9citations
  • 2006Electrical properties of epoxy resin based nano-composites152citations

Places of action

Chart of shared publication
Gu, Gong
1 / 3 shared
Yang, Bin
1 / 8 shared
Das, Sanjib
1 / 1 shared
Geohegan, David B.
1 / 2 shared
Joshi, Pooran C.
1 / 1 shared
Rouleau, Christopher M.
1 / 1 shared
Xiao, Kai
1 / 2 shared
Ellis, A. R.
2 / 16 shared
Polizos, Georgios
1 / 14 shared
Sauers, Isidor
2 / 21 shared
Messman, Jamie M.
1 / 1 shared
James, D. Randy
2 / 8 shared
Tuncer, Enis
2 / 39 shared
Sathyamurthy, Srivatsan
1 / 2 shared
Li, Jing
1 / 14 shared
Goyal, Amit
1 / 3 shared
Chart of publication period
2016
2009
2006

Co-Authors (by relevance)

  • Gu, Gong
  • Yang, Bin
  • Das, Sanjib
  • Geohegan, David B.
  • Joshi, Pooran C.
  • Rouleau, Christopher M.
  • Xiao, Kai
  • Ellis, A. R.
  • Polizos, Georgios
  • Sauers, Isidor
  • Messman, Jamie M.
  • James, D. Randy
  • Tuncer, Enis
  • Sathyamurthy, Srivatsan
  • Li, Jing
  • Goyal, Amit
OrganizationsLocationPeople

article

Polyamide 66 as a cryogenic dielectric

  • Ellis, A. R.
  • Polizos, Georgios
  • Sauers, Isidor
  • Messman, Jamie M.
  • James, D. Randy
  • Aytug, Tolga
  • Tuncer, Enis
Abstract

mprovements in superconductor and cryogenic technologies enable novel power apparatus, e.g., cables, transformers, fault current limiters, generators, it etc., with better device characteristics than their conventional counterparts. In these applications electrical insulation materials play an important role in system weight, footprint (size), and voltage level. The trend in the electrical insulation material selection has been to adapt or to employ conventional insulation materials to these new systems. However, at low temperatures, thermal contraction and loss of mechanical strength in many materials make them unsuitable for superconducting power applications. In this paper, a widely used commercial material was characterized as a potential cryogenic dielectric. The material is used in “oven bags” which is a heat-resistant polyamide (nylon) used in cooking (produced by Reynolds ® , Richmond, VA, USA). It is first characterized by Fourier transform infrared and X-ray diffraction techniques and determined to be composed of polyamide 66 (PA66) polymer. Secondly the complex dielectric permittivity and dielectric breakdown strength of the PA66 films are investigated. The dielectric data are then compared with data reported in the literature. A comparison of dielectric strength with a widely used high-temperature superconductor electrical insulation material, polypropylene-laminated paper ( PPLP ™ a product of Sumitomo Electric Industries, Japan), is provided. It is observed that the statistical analysis of the PA66 films yields 1% failure probability at 127 kV mm - 1 ; this value is approximately 46 kV mm - 1 higher than PPLP ™ . Comparison of the mechanical properties of PA and PPLP ™ indicates that PA66 has low storage and loss moduli than PPLP ™ . It is concluded that PA66 may be a good candidate for cryogenic applications. Finally, a summary of dielectric properties of some of the commercial tape insulation materials and various polymers is also provided.

Topics
  • impedance spectroscopy
  • polymer
  • x-ray diffraction
  • strength
  • dielectric strength
  • dielectric breakdown strength