Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2014Uncertainty of pin height measurement for the determination of wear in pin-on-plate test2citations

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Chiffre, Leonardo De
1 / 39 shared
Poulios, Konstantinos
1 / 21 shared
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2014

Co-Authors (by relevance)

  • Chiffre, Leonardo De
  • Poulios, Konstantinos
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article

Uncertainty of pin height measurement for the determination of wear in pin-on-plate test

  • Chiffre, Leonardo De
  • Poulios, Konstantinos
  • Drago, Nicola
Abstract

The paper concerns measurement of pin height for the determination of wear in a pin-on-plate (POP) or pin-on-disc (POD) test, where a pin is mounted on a holder that can be fixed on the test rig and removed for measurements. The amount of wear is assessed as difference of pin height before and after the test, using the distance between holder plane and pin friction plane as measurand. A series of measurements were performed in connection with POP testing of different friction material pins mounted on an aluminium holder. Pin height measurements were carried out on a coordinate measuring machine (CMM), achieving an expanded measurement uncertainty (k = 2) better than 1 mm. A simple dedicated fixture adaptable to workshop environment was developed and its metrological capability investigated, estimating an average uncertainty of measurement in the order of 5 mm (k = 2). Fixture measurements were compared with CMM measurements using the normalised En value. Acceptable En values (En &lt; 1) were obtained in 58% of the measurements, showing a discrepancy which was explained in terms of different probing patterns on CMM and fixture. ©2014 CIRP<br/>

Topics
  • impedance spectroscopy
  • aluminium