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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Farzin, Yousef Alizad
Karlsruhe Institute of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (6/6 displayed)
- 2023Perovskite/Ruddlesden-Popper composite fuel electrode of strontium-praseodymium-manganese oxide for solid oxide cells: An alternative candidatecitations
- 2022Development of an SFMM/CGO composite electrode with stable electrochemical performance at different oxygen partial pressurescitations
- 2022Development of an SFMM/CGO composite electrode with stable electrochemical performance at different oxygen partial pressurescitations
- 2022Fracture toughness of reactive bonded Co–Mn and Cu–Mn contact layers after long-term agingcitations
- 2020Low-temperature preparation and investigation of electrochemical properties of SFM/CGO composite electrodecitations
- 2020Low-temperature preparation and investigation of electrochemical properties of SFM/CGO composite electrodecitations
Places of action
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article
Fracture toughness of reactive bonded Co–Mn and Cu–Mn contact layers after long-term aging
Abstract
Creating a tough bond for the electrical contact between metallic interconnects and ceramic solid oxide cells (SOC) in a stack is challenging due to restrictions on the assembly temperature. The reactive oxidation bonding in the formation of Co<sub>2</sub>MnO<sub>4</sub> (CoMn) and Cu<sub>1.3</sub>Mn<sub>1.7</sub>O<sub>4</sub> (CuMn) spinel oxides from metallic precursors could provide a potential solution for achieving tough and well-conducting contact layers. These contact layers are deposited from metallic precursors onto CoCe-coated AISI441 substrates to achieve high toughness even after aging for 3000 h at typical operating temperatures for SOCs. The interface fracture energy of CoMn and CuMn contact layers was measured for as-sintered and aged samples by using a modified four-point bending test. After the fracture test, X-ray diffraction, electron microscopy, and energy-dispersive X-ray spectroscopy were used to determine phase evolution and possible reactions at the contact layer/interconnect interface. The results show that the interface fracture energy of sintered CoMn contact layer (6.1 J/m<sup>2</sup>) decreased to 2.9 J/m<sup>2</sup> after aging at 850 °C for 3000 h while the fracture energy for CuMn increased from 6.4 J/m<sup>2</sup> to 19.7 J/m<sup>2</sup>.