| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Fox, Neil A.
University of Bristol
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (14/14 displayed)
- 2023Deuterium retention in CVD diamondcitations
- 2022Ex-situ Ge-doping of CZTS Nanocrystals and CZTSSe Solar Absorber Filmscitations
- 2022Experimental studies of electron affinity and work function from titanium on oxidised diamond (100) surfacescitations
- 2022Ex situ Ge-doping of CZTS nanocrystals and CZTSSe solar absorber films.citations
- 2021An investigation into the surface termination and near-surface bulk doping of oxygen-terminated diamond with lithium at various annealing temperaturescitations
- 2020Pulsed laser deposition of single phase n- and p-type Cu2O thin films with low resistivitycitations
- 2020Diamond chemical vapor deposition using a zero-total gas flow environmentcitations
- 2019Anodization study of epitaxial graphenecitations
- 2019Surface Investigation on Electrochemically Deposited Lead on Goldcitations
- 2019Anodization study of epitaxial graphene : insights on the oxygen evolution reaction of graphitic materialscitations
- 2018A perspective on the application of spatially resolved ARPES for 2D materialscitations
- 2018Molybdenum Gratings as a High Temperature Refractory Platform for Plasmonic Heat Generators in the Infraredcitations
- 2018Impact of Sb and Na Doping on the Surface Electronic Landscape of Cu2ZnSnS4 Thin Filmscitations
- 2018Surface structure of few layer graphenecitations
Places of action
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article
Surface structure of few layer graphene
Abstract
Understanding surface structure of graphene is important for its integration into composite materials. Here, we have used synchrotron X-ray reflectivity (XRR) to study the structure of commercially available graphene samples (prepared via chemical vapor deposition, and marketed as graphene monolayers) on SiO 2 /Si at different temperatures. X-ray photoelectron spectroscopy, photoemission electron microscopy and atomic force microscopy (AFM) were employed to evaluate the composition and morphology of the graphene layer. Our results indicate that the samples we characterized consisted of 3–4 layers of graphene, which should thus be more accurately described as few layer graphene (FLG). Furthermore, a “contaminant” layer, comprising polymethylmethacrylate and graphene multilayers, was found present atop FLG. We also report tentative results on the effect of temperature on the graphene sample thickness. At 25 °C, the FLG thickness from XRR measurements was 13.0 ± 1.0 Å, in agreement with that obtained from AFM (13.9 ± 0.7 Å). Upon heating to 60 °C, the FLG thickness expanded to 13.8 Å, which further increased to 14.3 Å upon cooling to 25 °C. We attribute this temperature dependent thickness to the out-of-plane rippling of graphene as previously reported. These unprecedented results on the FLG surface structure are valuable to its potential bioanalytical applications.