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Canteri, Roberto
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Publications (4/4 displayed)
- 2024On the structure and properties of hydrothermally toughened soda–lime silicate float glasscitations
- 2021Atomic layer deposition of palladium coated TiO<inf>2</inf>/Si nanopillars: ToF-SIMS, AES and XPS characterization studycitations
- 2013The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF-SIMS spectracitations
- 2000Structural and compositional study of B-C-N films produced by laser ablation of B4C targets in N2 atmosphere
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article
Atomic layer deposition of palladium coated TiO<inf>2</inf>/Si nanopillars: ToF-SIMS, AES and XPS characterization study
Abstract
<p>Nanocomposite based on Palladium (Pd) Coated TiO<sub>2</sub>/Si nanopillars is an attractive candidate for photocatalytic applications because of its outstanding electrochemical and optical characteristics. In this research, Pd/TiO<sub>2</sub>/Si nanopillars were synthesized by combination of metal-assisted chemical etching and atomic layer deposition, and then the surface was investigated by means of Electron microscopy, Time-of-Flight Secondary Ion Mass-Spectrometry (ToF-SIMS), Auger Electron Spectroscopy (AES) and X-Ray Photoelectron spectroscopy (XPS). The spatial distribution of different chemical components and contaminations on the surface of the produced nanocomposites was evaluated by ToF-SIMS mapping. Depth profiling by AES was carried out to determine the chemical composition and the conformality of Pd and TiO<sub>2</sub> layer over the Si pillars. The elemental composition and stoichiometry were determined by XPS analysis. The XPS valence band analysis was performed in order to investigate the modification of TiO<sub>2</sub>/Si nanopillars electronic structure after Pd deposition. It was found that the Pd coating decreases the concentration of photoactive defects that can reduce the photoelectrochemical efficiency of TiO<sub>2</sub>.</p>