| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Aureau, Damien
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (18/18 displayed)
- 2024Interface defect formation for atomic layer deposition of SnO2 on metal halide perovskitescitations
- 2024In situ evaluation of the strontium vandate oxide reactivity by NAP-XPS
- 2023Formation and Etching of the Insulating Sr‐Rich V 5+ Phase at the Metallic SrVO 3 Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2023Formation and Etching of the Insulating Sr‐Rich V<sup>5+</sup> Phase at the Metallic SrVO<sub>3</sub> Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2022(Invited, Digital Presentation) Outstanding Contributions of Liquid Ammonia on III-V Semiconductors (Photo)-Electrochemistry
- 2022Oxide thin film depth profiling: interest and limitations of argon sputtering for photoemission spectroscopy
- 2021XPS monitoring of SrVO3 thin films from demixing to air ageing: The asset of treatment in watercitations
- 2021Highly Transparent and Conductive Indium‐Free Vanadates Crystallized at Reduced Temperature on Glass Using a 2D Transparent Nanosheet Seed Layercitations
- 2020Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrixcitations
- 2020Transfer of Epitaxial SrTiO 3 Nanothick Layers Using Water-Soluble Sacrificial Perovskite Oxidescitations
- 2019Cu(InGa)Se 2 Solar Cell Efficiency Enhancement Using a Yb-Doped SnO x Photon Converting Layercitations
- 2019Evidence of Reversible Oxidation at CuInSe2 Grain Boundaries
- 2018The Evaluation of the Perturbations Induced By Ionic Bombardment on Surfaces: A Challengefor Interfacial Electrochemistry
- 2018Tuning the electronic properties of LaAlO 3 / SrTiO 3 interfaces by irradiating the LaAlO 3 surface with low-energy cluster ion beamscitations
- 2017The Role of Oxygen in the Degradation of Methylammonium Lead Trihalide Perovskite Photoactive Layers
- 2016Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO 3 by Argon Cluster Sputteringcitations
- 2016Förster resonance energy transfer between individual semiconductor nanocrystals and an InP filmcitations
- 2015Water adsorption on TiO2 surfaces probed by soft X-ray spectroscopies: bulk materials vs. isolated nanoparticlescitations
Places of action
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article
Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix
Abstract
Self-organized epitaxial nanorods, obtained by an adapted annealing process after deposition of metallic strontium vanadate perovskite (SrVO3) thin films, are analyzed to determine their structural, chemical and electrical properties. After the identification of the Sr3V2O8 phase of the nanorods by electron diffraction; Electron Energy Loss Spectroscopy investigations show the vanadium oxidation state (V5+ ) for the nanorods. Two scanning probe techniques are deployed to determine the specific local electrical properties of these Sr3V2O8 nanorods. In ambient conditions, local electrical properties are studied by Scanning Spreading Resistance Microscopy based on an Atomic Force Microscope and multiple probe scanning tunneling microscopy is used for the study in ultrahigh vacuum. Both techniques reveal that local electrical resistances of the nanorods are five order of magnitude higher than the resistance of the perovskite SrVO3 matrix. Futhermore, the nanorods are found to be etched by repeating scanning of the conducive Atomic Force Microcopy probe, enabling a three-dimensional depth profile of the nanorods resistance with 3D-Spreading Resistance Microscopy mode. A partial embedding of the nanorods in the underlying SrVO3 film is proved and the impact of the water meniscus at the origin of the selective etching observed during Scanning Spreading Resistance Microscopy, in ambient conditions, is discussed.