| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Fouchet, Arnaud
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (19/19 displayed)
- 2024In situ evaluation of the strontium vandate oxide reactivity by NAP-XPS
- 2023Modeling of SrTiO3 polycrystalline substrate grain growth for tuning thin film functional propertiescitations
- 2023Amido bisphosphonic acid as anchoring agent and photopolymerization initiator onto zirconium oxide surfacecitations
- 2023Artificial Aging of Thin Films of the Indium-Free Transparent Conducting Oxide SrVO 3citations
- 2023Structural, optical, and electrical properties of TiO$_2$ thin films deposited by ALD: Impact of the substrate, the deposited thickness and the deposition temperaturecitations
- 2023Controlling mesenchymal stem cell differentiation using vanadium oxide thin film surface wettabilitycitations
- 2023Formation and Etching of the Insulating Sr‐Rich V 5+ Phase at the Metallic SrVO 3 Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2023Formation and Etching of the Insulating Sr‐Rich V<sup>5+</sup> Phase at the Metallic SrVO<sub>3</sub> Surface Revealed by Operando XAS Spectroscopy Characterizationscitations
- 2023Strontium Vanadate Deposited by ALD: Toward a New Synthesis Approach
- 2022Tunable magnetic and magnetotransport properties in locally epitaxial La 0.67 Sr 0.33 MnO 3 thin films on polycrystalline SrTiO 3 , by control of grain sizecitations
- 2021Differentiation of mesenchymal stem cells using metal oxide thin filmscitations
- 2021XPS monitoring of SrVO3 thin films from demixing to air ageing: The asset of treatment in watercitations
- 2021Highly Transparent and Conductive Indium‐Free Vanadates Crystallized at Reduced Temperature on Glass Using a 2D Transparent Nanosheet Seed Layercitations
- 2020Ca-3(VO4)(2) Nanowires on Metallic CaVO3 Films as Nanocapacitorscitations
- 2020Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrixcitations
- 2020Transfer of Epitaxial SrTiO 3 Nanothick Layers Using Water-Soluble Sacrificial Perovskite Oxidescitations
- 2019Tuning of the Optical Properties of the Transparent Conducting Oxide SrVO3 by Electronic Correlationscitations
- 2018Tuning the electronic properties of LaAlO 3 / SrTiO 3 interfaces by irradiating the LaAlO 3 surface with low-energy cluster ion beamscitations
- 2016Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO 3 by Argon Cluster Sputteringcitations
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article
Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix
Abstract
Self-organized epitaxial nanorods, obtained by an adapted annealing process after deposition of metallic strontium vanadate perovskite (SrVO3) thin films, are analyzed to determine their structural, chemical and electrical properties. After the identification of the Sr3V2O8 phase of the nanorods by electron diffraction; Electron Energy Loss Spectroscopy investigations show the vanadium oxidation state (V5+ ) for the nanorods. Two scanning probe techniques are deployed to determine the specific local electrical properties of these Sr3V2O8 nanorods. In ambient conditions, local electrical properties are studied by Scanning Spreading Resistance Microscopy based on an Atomic Force Microscope and multiple probe scanning tunneling microscopy is used for the study in ultrahigh vacuum. Both techniques reveal that local electrical resistances of the nanorods are five order of magnitude higher than the resistance of the perovskite SrVO3 matrix. Futhermore, the nanorods are found to be etched by repeating scanning of the conducive Atomic Force Microcopy probe, enabling a three-dimensional depth profile of the nanorods resistance with 3D-Spreading Resistance Microscopy mode. A partial embedding of the nanorods in the underlying SrVO3 film is proved and the impact of the water meniscus at the origin of the selective etching observed during Scanning Spreading Resistance Microscopy, in ambient conditions, is discussed.