Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2020Enhancing photocatalytic performance and solar absorption by schottky nanodiodes heterojunctions in mechanically resilient palladium coated TiO2/Si nanopillars by atomic layer deposition36citations
  • 2020Enhancing photocatalytic performance and solar absorption by schottky nanodiodes heterojunctions in mechanically resilient palladium coated TiO2/Si nanopillars by atomic layer deposition36citations
  • 2020Porous Silicon‐Zinc Oxide Nanocomposites Prepared by Atomic Layer Deposition for Biophotonic Applications27citations
  • 2020Porous Silicon-Zinc Oxide Nanocomposites Prepared by Atomic Layer Deposition for Biophotonic Applications27citations
  • 2019Effect of porous silicon substrate on structural, mechanical and optical properties of MOCVD and ALD ruthenium oxide nanolayers16citations
  • 2017Silicon/TiO<inf>2</inf> core-shell nanopillar photoanodes for enhanced photoelectrochemical water oxidation39citations
  • 2015Tailoring the structural, optical, and photoluminescence properties of porous silicon/TiO<inf>2</inf> nanostructures54citations
  • 2015Structural and XPS studies of PSi/TiO2 nanocomposites prepared by ALD and Ag-assisted chemical etching88citations

Places of action

Chart of shared publication
Bechelany, Mikhael
2 / 109 shared
Balme, Sébastien
1 / 9 shared
Weber, Matthieu
2 / 35 shared
Coy, Emerson
2 / 23 shared
Iatsunskyi, Igor
8 / 59 shared
Siuzdak, Katarzyna
3 / 13 shared
Załęski, Karol
5 / 41 shared
Miele, Philippe
2 / 46 shared
Ziółek, Marcin
1 / 6 shared
Graniel, Octavio
2 / 6 shared
Emerson Coy, Phd, Dsc.
3 / 38 shared
Ziolek, Marcin
1 / 4 shared
Balme, Sebastien
1 / 11 shared
Gottardi, Gloria
2 / 26 shared
Jancelewicz, Mariusz
4 / 12 shared
Myndrul, Valerii
3 / 5 shared
Smyntyna, Valentyn
2 / 7 shared
Brytavskyi, Ievgen
1 / 1 shared
Yate, Luis
1 / 17 shared
Hušeková, Kristína
1 / 3 shared
Romero, Luis Emerson Coy
1 / 35 shared
Gregušová, Dagmar
1 / 2 shared
Jurga, Stefan
3 / 59 shared
Ramanavicius, Arunas
1 / 10 shared
Baleviciute, Ieva
1 / 2 shared
Nowaczyk, Grzegorz
2 / 20 shared
Jancelewicz, Mariusz Andrzej
1 / 4 shared
Viter, Roman
1 / 15 shared
Kempinski, Mateusz
1 / 2 shared
Chart of publication period
2020
2019
2017
2015

Co-Authors (by relevance)

  • Bechelany, Mikhael
  • Balme, Sébastien
  • Weber, Matthieu
  • Coy, Emerson
  • Iatsunskyi, Igor
  • Siuzdak, Katarzyna
  • Załęski, Karol
  • Miele, Philippe
  • Ziółek, Marcin
  • Graniel, Octavio
  • Emerson Coy, Phd, Dsc.
  • Ziolek, Marcin
  • Balme, Sebastien
  • Gottardi, Gloria
  • Jancelewicz, Mariusz
  • Myndrul, Valerii
  • Smyntyna, Valentyn
  • Brytavskyi, Ievgen
  • Yate, Luis
  • Hušeková, Kristína
  • Romero, Luis Emerson Coy
  • Gregušová, Dagmar
  • Jurga, Stefan
  • Ramanavicius, Arunas
  • Baleviciute, Ieva
  • Nowaczyk, Grzegorz
  • Jancelewicz, Mariusz Andrzej
  • Viter, Roman
  • Kempinski, Mateusz
OrganizationsLocationPeople

article

Effect of porous silicon substrate on structural, mechanical and optical properties of MOCVD and ALD ruthenium oxide nanolayers

  • Smyntyna, Valentyn
  • Iatsunskyi, Igor
  • Brytavskyi, Ievgen
  • Załęski, Karol
  • Yate, Luis
  • Pavlenko, Mykola
  • Hušeková, Kristína
  • Romero, Luis Emerson Coy
  • Gregušová, Dagmar
  • Myndrul, Valerii
Abstract

<p>Ruthenium oxide (RuO<sub>2</sub>) has received significant attention in recent years for its photocatalytic properties and photoelectrochemical (PEC) performance. In the present research, RuO<sub>2</sub>nanolayers were grown on n-type porous silicon (PSi) by metal organic chemical vapor deposition (MOCVD) and atomic layer deposition (ALD). The morphology, mechanical and optical properties of produced nanostructures were studied by means of scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), micro-Raman spectroscopy, diffuse reflectance and photoluminescence (PL) spectroscopy. It was shown that that MOCVD gives non-uniform distribution of RuO<sub>2</sub>along the pore and it is deposited mainly in the near-surface of PSi, while distribution of ruthenium obtained by ALD looks conformal over the entire pore. The mean size of RuO<sub>2</sub>nanocrystallites and mechanical stresses were determined by TEM, XRD and Raman spectroscopy. It was demonstrated that samples obtained by ALD demonstrate a good crystallinity, while crystalline phase for samples produced by MOCVD improve with RuO<sub>2</sub>layer thickness increasing. It was established the formation of hydrated RuO<sub>2</sub>during ALD and MOCVD. It was shown that the samples produced by MOCVD have slightly higher electrical conductivity than ALD samples. The average value of energy gap (E<sub>g</sub>) for samples prepared by MOCVD depended on the number of injections. RuO<sub>2</sub>nanolayers quenched intrinsic PL from the PSi matrix. The correlation between structural, optical, and mechanical properties of samples produced by MOCVD and ALD was discussed.</p>

Topics
  • porous
  • impedance spectroscopy
  • pore
  • surface
  • photoluminescence
  • scanning electron microscopy
  • x-ray diffraction
  • x-ray photoelectron spectroscopy
  • crystalline phase
  • transmission electron microscopy
  • Silicon
  • Energy-dispersive X-ray spectroscopy
  • Raman spectroscopy
  • electrical conductivity
  • crystallinity
  • chemical vapor deposition
  • atomic layer deposition
  • Ruthenium