Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2016Investigation of various properties of HfO2-TiO2 thin film composites deposited by multi-magnetron sputtering system21citations
  • 2015Investigation of structural, optical and micro-mechanical properties of (NdyTi1-y)O-x thin films deposited by magnetron sputtering14citations

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Chart of shared publication
Mazur, Michal
2 / 12 shared
Gibson, Desmond
2 / 23 shared
Poniedziałek, A.
1 / 1 shared
Kaczmarek, Danuta
2 / 4 shared
Wojcieszak, Damian
2 / 4 shared
Zhu, Wenzhong
1 / 10 shared
Placido, Frank
1 / 5 shared
Song, Shigeng
1 / 8 shared
Mazur, Piotr
1 / 3 shared
Howind, Torsten
1 / 7 shared
Chart of publication period
2016
2015

Co-Authors (by relevance)

  • Mazur, Michal
  • Gibson, Desmond
  • Poniedziałek, A.
  • Kaczmarek, Danuta
  • Wojcieszak, Damian
  • Zhu, Wenzhong
  • Placido, Frank
  • Song, Shigeng
  • Mazur, Piotr
  • Howind, Torsten
OrganizationsLocationPeople

article

Investigation of various properties of HfO2-TiO2 thin film composites deposited by multi-magnetron sputtering system

  • Mazur, Michal
  • Gibson, Desmond
  • Poniedziałek, A.
  • Kaczmarek, Danuta
  • Wojcieszak, Damian
  • Domaradzki, Jaroslaw
Abstract

n this work the properties of hafnium dioxide (HfO<sub>2</sub>), titanium dioxide (TiO<sub>2</sub>) and mixed HfO<sub>2</sub>-TiO<sub>2</sub> thin films with various amount of titanium addition, deposited by magnetron sputtering were described. Structural, surface, optical and mechanical properties of deposited coatings were analyzed. Based on X-ray diffraction and Raman scattering measuremets it was observed that there was a significant influence of titanium concentration in mixed TiO<sub>2</sub>-HfO<sub>2</sub> thin films on their microstructure. Increase of Ti content in prepared mixed oxides coatings caused, e.g. a decrease of average crystallite size and amorphisation of the coatings. As-deposited hafnia and titania thin films exhibited nanocrystalline structure of monoclinic phase and mixed anatase-rutile phase for HfO<sub>2</sub> and TiO<sub>2</sub> thin films, respectively. Atomic force microscopy investigations showed that the surface of deposited thin films was densely packed, crack-free and composed of visible grains. Surface roughness and the value of water contact angle decreased with the increase of Ti content in mixed oxides. Results of optical studies showed that all deposited thin films were well transparent in a visible light range. The effect of the change of material composition on the cut-off wavelength, refractive index and packing density was also investigated. Performed measurements of mechanical properties revealed that hardness and Young’s elastic modulus of thin films were dependent on material composition. Hardness of thin films increased with an increase of Ti content in thin films, from 4.90GPa to 13.7GPa for HfO<sub>2</sub> and TiO<sub>2</sub>, respectively. The results of the scratch resistance showed that thin films with proper material composition can be used as protective coatings in optical devices.

Topics
  • density
  • surface
  • grain
  • phase
  • x-ray diffraction
  • thin film
  • atomic force microscopy
  • crack
  • composite
  • hardness
  • titanium
  • hafnium