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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Varela, M.
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Topics
Publications (10/10 displayed)
- 2024Gas tungsten arc welding of a multiphase CoCuxFeMnNi (x=20,30) high entropy alloy system ; Microstructural differences and their consequences on mechanical performancecitations
- 2024Gas tungsten arc welding of a multiphase CoCu$_x$FeMnNi (x=20,30) high entropy alloy system: Microstructural differences and their consequences on mechanical performancecitations
- 2021Structural and optical properties of self-assembled AlN nanowires grown on SiO2/Si substrates by molecular beam epitaxycitations
- 2017Structural, magnetic and electronic properties of pulsed-laser-deposition grown $mathrm{SrFeO_{3−delta}}$ thin films and $mathrm{SrFeO_{3−delta}/La_{2/3}Ca_{1/3}MnO_{3}}$ multilayerscitations
- 2016Orientation dependent Ti diffusion in YNMO/STO thin films deposited by pulsed laser depositioncitations
- 2015Paving the way to nanoionics: atomic origin of barriers for ionic transport through interfacescitations
- 2012Nanoscale strain-induced pair suppression as a vortex-pinning mechanism in high-temperature superconductorscitations
- 2012Dielectric properties of (Bi0.9La0.1)(2)NiMnO6 thin films:Determining the intrinsic electric and magnetoelectric responsecitations
- 2008Metallic Nanoparticles Embedded in a Dielectric Matrix: Growth Mechanisms and Percolationcitations
- 2007Interpreting atomic-resolution spectroscopic imagescitations
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article
Orientation dependent Ti diffusion in YNMO/STO thin films deposited by pulsed laser deposition
Abstract
<p>Epitaxial thin films of double perovskite Y(Ni<sub>0.5</sub>Mn<sub>0.5</sub>)O<sub>3</sub>(001) and Y(Ni<sub>0.5</sub>Mn<sub>0.5</sub>)O<sub>3</sub>(101) grown on SrTiO<sub>3</sub>(001) and SrTiO<sub>3</sub>(111), respectively, were studied by XPS and SQUID magnetometer. Temperature dependent Ti diffusion was detected in the Y(Ni<sub>0.5</sub>Mn<sub>0.5</sub>)O<sub>3</sub>(101)/SrTiO<sub>3</sub>(111) samples, while no diffusion was observed in Y(Ni<sub>0.5</sub>Mn<sub>0.5</sub>)O<sub>3</sub>(001)/SrTiO<sub>3</sub>(001) samples. It was observed that the use of a low ablation rate promoted ionic migrations, mainly due to the associated annealing time that samples undergo when grown at lower rates. The migration speed was determined by XPS analysis and its influence on the magnetic properties of the Y(Ni<sub>0.5</sub>Mn<sub>0.5</sub>)O<sub>3</sub>(101) films was characterized and discussed.</p>