Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2013Effects of self-assembled monolayer structural order, surface homogeneity and surface energy on pentacene morphology and thin film transistor device performance73citations
  • 2012Bottom-contact small-molecule n-type organic field effect transistors achieved via simultaneous modification of electrode and dielectric surfaces16citations
  • 2012Solid-state densification of spun-cast self-assembled monolayers for use in ultra-thin hybrid dielectrics15citations
  • 2011Simultaneous modification of bottom-contact electrode and dielectric surfaces for organic thin-film transistors through single-component spin-cast monolayers82citations
  • 2010Effect of the phenyl ring orientation in the polystyrene buffer layer on the performance of pentacene thin-film transistors34citations
  • 2009Study on the formation of self-assembled monolayers on sol-gel processed hafnium oxide as dielectric layers53citations

Places of action

Chart of shared publication
Polishak, Brent
1 / 1 shared
Baio, Joe
1 / 1 shared
Hutchins, Daniel Orrin
1 / 1 shared
Cernetic, Nathan
3 / 3 shared
Weidner, Tobias
5 / 29 shared
Ma, Hong
5 / 14 shared
Baio, Joe E.
2 / 13 shared
Hutchins, Daniel O.
2 / 2 shared
Castner, David G.
3 / 12 shared
Dubey, Manish
1 / 2 shared
Omalley, Kevin M.
1 / 2 shared
Gage, Alexander H.
1 / 1 shared
Lovejoy, Tracy C.
1 / 2 shared
Ting, Guy G.
1 / 1 shared
Kim, Tae-Wook
1 / 1 shared
Baio, J. E.
1 / 5 shared
Hutchins, Daniel
1 / 1 shared
Wang, Ying
1 / 16 shared
Ohuchi, Fumio S.
1 / 3 shared
Ting, Guy
1 / 1 shared
Maa, Hong
1 / 1 shared
Shamberge, Patrick J.
1 / 1 shared
Ka, Jae Won
1 / 1 shared
Ii, Guy G. Ting
1 / 1 shared
Chart of publication period
2013
2012
2011
2010
2009

Co-Authors (by relevance)

  • Polishak, Brent
  • Baio, Joe
  • Hutchins, Daniel Orrin
  • Cernetic, Nathan
  • Weidner, Tobias
  • Ma, Hong
  • Baio, Joe E.
  • Hutchins, Daniel O.
  • Castner, David G.
  • Dubey, Manish
  • Omalley, Kevin M.
  • Gage, Alexander H.
  • Lovejoy, Tracy C.
  • Ting, Guy G.
  • Kim, Tae-Wook
  • Baio, J. E.
  • Hutchins, Daniel
  • Wang, Ying
  • Ohuchi, Fumio S.
  • Ting, Guy
  • Maa, Hong
  • Shamberge, Patrick J.
  • Ka, Jae Won
  • Ii, Guy G. Ting
OrganizationsLocationPeople

article

Solid-state densification of spun-cast self-assembled monolayers for use in ultra-thin hybrid dielectrics

  • Baio, Joe E.
  • Hutchins, Daniel O.
  • Cernetic, Nathan
  • Weidner, Tobias
  • Acton, Orb
  • Ma, Hong
  • Castner, David G.
Abstract

Ultra-thin self-assembled monolayer (SAM)-oxide hybrid dielectrics have gained significant interest for their application in low-voltage organic thin film transistors (OTFTs). A [8-(11-phenoxy-undecyloxy)-octyl]phosphonic acid (PhO-19-PA) SAM on ultrathin AlO <sub>x</sub> (2.5 nm) has been developed to significantly enhance the dielectric performance of inorganic oxides through reduction of leakage current while maintaining similar capacitance to the underlying oxide structure. Rapid processing of this SAM in ambient conditions is achieved by spin coating, however, as-cast monolayer density is not sufficient for dielectric applications. Thermal annealing of a bulk spun-cast PhO-19-PA molecular film is explored as a mechanism for SAM densification. SAM density, or surface coverage, and order are examined as a function of annealing temperature. These SAM characteristics are probed through atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and near edge X-ray absorption fine structure spectroscopy (NEXAFS). It is found that at temperatures sufficient to melt the as-cast bulk molecular film, SAM densification is achieved; leading to a rapid processing technique for high performance SAM-oxide hybrid dielectric systems utilizing a single wet processing step. To demonstrate low-voltage devices based on this hybrid dielectric (with leakage current density of 7.7 × 10 <sup>-8</sup> A cm <sup>-2</sup> and capacitance density of 0.62 μF cm <sup>-2</sup> at 3 V), pentacene thin-film transistors (OTFTs) are fabricated and yield sub 2 V operation and charge carrier mobilites of up to 1.1 cm <sup>2</sup> V <sup>-1</sup> s <sup>-1</sup>. © 2012 Elsevier B.V. All rights reserved.

Topics
  • density
  • impedance spectroscopy
  • surface
  • thin film
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • melt
  • annealing
  • current density
  • densification
  • scanning auger microscopy
  • spin coating
  • near-edge X-ray absorption fine structure spectroscopy