Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2009Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)23citations
  • 2008Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)22citations
  • 2007Spectroscopic characterisation of novel materials for semiconductor device applicationscitations
  • 2006Growth of CuCl thin films by magnetron sputtering for ultraviolet optoelectronic applications38citations

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Chart of shared publication
Smith, Kevin E.
2 / 10 shared
Matsuura, Anne
1 / 1 shared
Piper, Louis
1 / 2 shared
Blueser, Andrew
1 / 1 shared
Demasi, Alex
2 / 2 shared
Zhang, Yufeng
2 / 4 shared
Hughes, Greg
1 / 13 shared
Wang, Shancai
1 / 2 shared
Matsuura, A. Y.
1 / 3 shared
Piper, L. F. J.
1 / 7 shared
Daniels, Stephen
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Mcnally, Patrick J.
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Oreilly, Lisa
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Natarajan, Gomathi
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Lucas, Francis Olabanji
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Bradley, Ann Louise
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Rajendra Kumar, Ramasamy Thangavelu
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Mitra, Anirban
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Cameron, David C.
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Co-Authors (by relevance)

  • Smith, Kevin E.
  • Matsuura, Anne
  • Piper, Louis
  • Blueser, Andrew
  • Demasi, Alex
  • Zhang, Yufeng
  • Hughes, Greg
  • Wang, Shancai
  • Matsuura, A. Y.
  • Piper, L. F. J.
  • Daniels, Stephen
  • Mcnally, Patrick J.
  • Oreilly, Lisa
  • Natarajan, Gomathi
  • Lucas, Francis Olabanji
  • Bradley, Ann Louise
  • Rajendra Kumar, Ramasamy Thangavelu
  • Mitra, Anirban
  • Cameron, David C.
OrganizationsLocationPeople

article

Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)

  • Smith, Kevin E.
  • Matsuura, Anne
  • Piper, Louis
  • Blueser, Andrew
  • Demasi, Alex
  • Zhang, Yufeng
  • Reid, Ian
  • Hughes, Greg
Abstract

<p>The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations.</p>

Topics
  • density
  • theory
  • thin film
  • x-ray photoelectron spectroscopy
  • semiconductor
  • chemical composition
  • copper
  • density functional theory
  • near-edge X-ray absorption fine structure spectroscopy
  • soft X-ray emission spectroscopy